


DPA Test for Zener Diodes
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
DPA Test for Zener Diodes
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
42181 results found for Zener/Diode/Discretes
Part reference
Quality level / QPL
Package
Power Dissipation [Max]
TID (krads)
Reverse Current [Max]
Zener Impedance [Max]
Zener Voltage [Nom]
Unit price
Lead time
JANTX
Qualified
QPDSIS-19500
Surface Mount
Melf A (US)
1,5W
0,5uA
3ohms
8,2V
JANTXV
Qualified
QPDSIS-19500
Surface Mount
LCC-4 (UB)
0,5W
0,01uA
1ohms
87V
JAN
Qualified
QPDSIS-19500
Surface Mount
LCC-4 (UB)
0,5W
0,01uA
300ohms
51V
JANS
Qualified
QPDSIS-19500
Surface Mount
LCC-4 (UB)
0,5W
2,5uA
16500ohms
3,9V
JANTXV
Qualified
QPDSIS-19500
Surface Mount
Melf A (US)
1,5W
0,25uA
250ohms
100V
JAN
Qualified
QPDSIS-19500
Through Hole Mount
DO-204AH (DO-35)
0,5W
0,5uA
105ohms
47V
JANTXV
Qualified
QPDSIS-19500
Surface Mount
Melf E (US)
5W
2uA
125ohms
110V
JAN
Qualified
QPDSIS-19500
Surface Mount
DO-213AA
0,5W
0,5uA
270ohms
75V
JANTXV
Qualified
QPDSIS-19500
Through Hole Mount
DO-204AH (DO-35)
0,5W
1uA
9,5ohms
11V
JAN
Qualified
QPDSIS-19500
Surface Mount
LCC-4 (UB)