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DPA Test for Varactor Diodes

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

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EEE Parts Results Page

DPA Test for Varactor Diodes

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

EEE Parts Results Page

Applications expected requirements
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  • Discretes
    • Diode
      • RF-Microwave Diode
        • Varactor

1461 results found for Varactor/RF-Microwave Diode/Diode/Discretes

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Part reference
Quality level / QPL
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Package
Power Dissipation [Max]
TID (krads)
Forward Current [Max]
Total Capacitance [Max]
Working Peak Reverse Voltage [Max]
Unit price
Lead time

JANTX1N5476B
1N5476B DO-204AA (DO-7)
Knox Semiconductors Inc
MIL-PRF-19500/436

Compare DCL / BOM Cart
JANTX
Not qualified
QPDSIS-19500
-65ºC to +175ºC
Through Hole Mount
DO-204AA (DO-7)
105pF
30V

JAN1N5145A
1N5145A DO-204AA (DO-7)
MicroMetrics
MIL-PRF-19500/383

Compare DCL / BOM Cart
JAN
Not qualified
QPDSIS-19500
-65ºC to +175ºC
Through Hole Mount
DO-204AA (DO-7)
28,3pF
60V

JANTX1N5470B
1N5470B DO-204AA (DO-7)
Knox Semiconductors Inc
MIL-PRF-19500/436

Compare DCL / BOM Cart
JANTX
Not qualified
QPDSIS-19500
-65ºC to +175ºC
Through Hole Mount
DO-204AA (DO-7)
34,65pF
30V

JAN1N5473B
1N5473B DO-204AA (DO-7)
Knox Semiconductors Inc
MIL-PRF-19500/436

Compare DCL / BOM Cart
JAN
Not qualified
QPDSIS-19500
-65ºC to +175ºC
Through Hole Mount
DO-204AA (DO-7)
58,8pF
30V

JANTX1N5472C
1N5472C DO-204AA (DO-7)
MicroMetrics
MIL-PRF-19500/436

Compare DCL / BOM Cart
JANTX
Not qualified
QPDSIS-19500
-65ºC to +175ºC
Through Hole Mount
DO-204AA (DO-7)
47,94pF
30V

JANTX1N5147A
1N5147A DO-204AA (DO-7)
Knox Semiconductors Inc
MIL-PRF-19500/383

Compare DCL / BOM Cart
JANTX
Not qualified
QPDSIS-19500
-65ºC to +175ºC
Through Hole Mount
DO-204AA (DO-7)
40,9pF
60V

JAN1N5467C
1N5467C DO-204AA (DO-7)
MicroMetrics
MIL-PRF-19500/436

Compare DCL / BOM Cart
JAN
Not qualified
QPDSIS-19500
-65ºC to +175ºC
Through Hole Mount
DO-204AA (DO-7)
20,4pF
30V

JANTX1N5469B
1N5469B DO-204AA (DO-7)
MicroMetrics
MIL-PRF-19500/436

Compare DCL / BOM Cart
JANTX
Not qualified
QPDSIS-19500
-65ºC to +175ºC
Through Hole Mount
DO-204AA (DO-7)
28,35pF
30V

JANTX1N5466C
1N5466C DO-204AA (DO-7)
Knox Semiconductors Inc
MIL-PRF-19500/436

Compare DCL / BOM Cart
JANTX
Not qualified
QPDSIS-19500
-65ºC to +175ºC
Through Hole Mount
DO-204AA (DO-7)
18,36pF
30V

JANTX1N5467B
1N5467B DO-204AA (DO-7)
MicroMetrics
MIL-PRF-19500/436

Compare DCL / BOM Cart
JANTX
Not qualified
QPDSIS-19500
-65ºC to +175ºC
Through Hole Mount
DO-204AA (DO-7)
21pF
30V
Part validation activities
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