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doEEEt DPA Test for VCO Oscillator | doEEEt.com
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DPA Test for VCO Oscillator

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

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EEE Parts Results Page

DPA Test for VCO Oscillator

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

EEE Parts Results Page

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  • Microcircuits
    • RF-Microwave Microcircuits
      • Frequency Generation
        • VCO

14 results found for VCO/Frequency Generation/RF-Microwave Microcircuits/Microcircuits

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Part reference
Quality level / QPL
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Package
Unit price
Lead time

MAOC-009263
MAOC-009263
MACOM Technology Solutions Inc
MFR DS MAOC-009263

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
QFN-32

MAOC-009262
MAOC-009262
MACOM Technology Solutions Inc
MFR DS MAOC-009262

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
QFN-32

5962-9204601M2A
SNJ54LS628FK
Texas Instruments
5962-92046

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20

5962-9682801H2C
MSK1343B
MSK Products Anaren Inc
5962-96828

Compare DCL / BOM Cart
QML H
Not qualified
QPDSIS-38534
-55ºC to +125ºC
Surface Mount
CQLCC-20

8102101FA
SNJ54LS629W
Texas Instruments
81021

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-16

SNJ54S124J
SNJ54S124J
Texas Instruments
QML_SNJ54S124_TEX_DS

Compare DCL / BOM Cart
883
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16

901200301B
CHV1203-98S
United Monolithic Semiconductors
ESCC 9012/003

Compare DCL / BOM Cart
ESCC B
Not qualified
ESCC QPL
-55ºC to +125ºC
DIE
DIE

901200301C
CHV1203-98S
United Monolithic Semiconductors
ESCC 9012/003

Compare DCL / BOM Cart
ESCC C
Not qualified
ESCC QPL
-55ºC to +125ºC
DIE
DIE

5962-9204601MCA
SNJ54LS628J
Texas Instruments
5962-92046

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-14

SNJ54S124W
SNJ54S124W
Texas Instruments
QML_SNJ54S124_TEX_DS

Compare DCL / BOM Cart
883
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-16
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