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DPA Test for Tunnel Diodes
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
DPA Test for Tunnel Diodes
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
20 results found for Tunnel/RF-Microwave Diode/Diode/Discretes
Part reference
Quality level / QPL
Package
Power Dissipation [Max]
TID (krads)
Forward Current [Max]
Total Capacitance [Max]
Unit price
Lead time
JAN
Not qualified
QPDSIS-19500
Through Hole Mount
DO-17
JANTX EQ
Not qualified
NOT LISTED IN QPL
Through Hole Mount
Axial
JANTX EQ
Not qualified
NOT LISTED IN QPL
Through Hole Mount
Axial
JANS EQ
Not qualified
NOT LISTED IN QPL
Through Hole Mount
Axial
JANTX EQ
Not qualified
NOT LISTED IN QPL
Through Hole Mount
Axial
JANS EQ
Not qualified
NOT LISTED IN QPL
Through Hole Mount
Axial
JANS EQ
Not qualified
NOT LISTED IN QPL
Through Hole Mount
Axial
JAN
Not qualified
QPDSIS-19500
Through Hole Mount
DO-17
JAN
Not qualified
QPDSIS-19500
Through Hole Mount
DO-17
HIGH RELIABILITY
Not qualified
NOT LISTED IN QPL
Through Hole Mount
Axial
Part validation activities
Cost & Activity Matrix