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doEEEt DPA Test for Transistor-Diode Array | doEEEt.com
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DPA Test for Transistor-Diode Array

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

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EEE Parts Results Page

DPA Test for Transistor-Diode Array

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

EEE Parts Results Page

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  • Microcircuits
    • Signal Acquisition-Conditioning
      • Transistor-Diode Array

59 results found for Transistor-Diode Array/Signal Acquisition-Conditioning/Microcircuits

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Part reference
Quality level / QPL
TOP
Package
Unit price
Lead time

M38510/14101BEA
2001JJAN
Microsemi a Microchip Company
MIL-M-38510/141

Compare DCL / BOM Cart
JAN B
Not qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16

5962-0150301HXC
MSK1665H
MSK Products Anaren Inc
5962-01503

Compare DCL / BOM Cart
QML H
Not qualified
QPDSIS-38534
-55ºC to +125ºC
Surface Mount
Hybrid PKG-4

MAT03-913H
MAT03-913H
Analog Devices
MFR SPEC ASD0011414

Compare DCL / BOM Cart
SPACE
Not qualified
ADI Space QPL
-55ºC to +125ºC
Through Hole Mount
TO-99

MAT03-903L
MAT03-903L
Analog Devices
MFR SPEC ASD0011414

Compare DCL / BOM Cart
SPACE
Not qualified
ADI Space QPL
-55ºC to +125ºC
Surface Mount
CFP-10

MAT02-000C
MAT02-000C
Analog Devices
MFR SPEC ASD0012815

Compare DCL / BOM Cart
SPACE
Not qualified
ADI Space QPL
-55ºC to +125ºC
DIE
DIE

ISL73128RHF/PROTO
ISL73128RHF/PROTO
Renesas Electronics formerly Intersil
MFR DS FN6475

Compare DCL / BOM Cart
PROTO
Not qualified
NOT LISTED IN QPL
+25ºC
Surface Mount
CFP-16

ISL73127RHX/SAMPLE
ISL73127RHX/SAMPLE
Renesas Electronics formerly Intersil
MFR DS FN6475

Compare DCL / BOM Cart
TESTED DIE
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
DIE
DIE

5962F0721806VXC
ISL73128EHVF
Renesas Electronics formerly Intersil
5962-07218

Compare DCL / BOM Cart
QML V
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-16

5962-9053801V2A
UC1611LQMLV
Texas Instruments
5962-90538

Compare DCL / BOM Cart
QML V
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20

5962-86058012A
SG2803L-DESC
Microsemi a Microchip Company
5962-86058

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20
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