


DPA Test for Timer
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
DPA Test for Timer
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
32 results found for Timer/Clock and Timing/Microcircuits
Part reference
Quality level / QPL
Package
TID (krads)
SEE (MeV/mg/cm2)
Counter Mode
Number of Bits
Number of Timers/Counters
Unit price
Lead time
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-8
Timer/Oscillator
1
QML V
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-8
Timer/Oscillator
1
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-14
Timer/Oscillator
2
PROTO
Not qualified
NOT LISTED IN QPL
Through Hole Mount
CDIP-24
Programmable Timer
16-Bits
3
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-24
TID (HDR): 100.0
SEL (Let): 60.0
SEU (Let): 22.0
Programmable Timer
16-Bits
3
JAN B
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
Timer/Oscillator
1
JAN B
Qualified
QPDSIS-38535
Through Hole Mount
TO-99
Timer/Oscillator
1
883
Not qualified
QPDSIS-38535
Surface Mount
CQLCC-44
Programmable Timer
16-Bits
3
JAN B
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20