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DPA Test for RF Variable Gain Amplifier
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
DPA Test for RF Variable Gain Amplifier
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
11 results found for Variable Gain Amplifier/RF Amplifiers/RF-Microwave Microcircuits/Microcircuits
Part reference
Quality level / QPL
Package
Unit price
Lead time
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
TO-99
SPACE
Not qualified
ADI Space QPL
Surface Mount
CFP-16
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-16
EP
Not qualified
NOT LISTED IN QPL
Surface Mount
WQFN-24
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-14
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
EP
Not qualified
NOT LISTED IN QPL
Surface Mount
QSOP-20
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-8
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-14
SPACE
Not qualified
ADI Space QPL
Surface Mount
CFP-16
Part validation activities
Cost & Activity Matrix