Skip to Content
  • Resources
    • COTS For Space WEBINARS
    • EEE Components
    • SPECIFICATIONS / QPLs
    • Events / Webinars
    • Space Talks
    • Tech Articles
    • Manufacturer Notifications
  • Laboratory Services
    • Laboratory Standard Testing
    • Non Standard Testing
    • Silicon Carbide -SiC- Diodes
    • CrowdTesting
    • Optoelectronics
    • Small Sats
    • Representative Projects / Papers
  • Additional Services
    • Industry 4.0 Cybersecurity (IEC 62443) NEW
    • Penetration Test NEW
    • Cybersecurity Certified (CSC) NEW
    • Code Score Matrix NEW
    • Long-term storage of wafers
    • Electronic Design
  • Tools
    • Comparator
    • MYDCLs / BOMs
    • esa-stockplace
  • About Us
  • Proposal Next
  • Sign In
Cookies on the doEEEt website. We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we'll assume that you are happy to receive all cookies on the doEEEt website. However, if you would like to, you can change your cookie settings at any time. Link to cookies policy.
doEEEt DPA Test for Potentiometer | doEEEt.com
  • Home
  • How does doEEEt works
  • About us
  • Contact Us
  • Terms of Use
  • Disclaimer
  • Privacy Policy
  • Privacy Policy and Legal Notice
  • Cookie Policy
  • Copyright
  • autosignup2
  • Instant Quote
  • Introducing NanoXplore And Its European FPGA’s ITAR Free
  • Space Talks 3 - Dan Friedlander
  • autosignup3
  • Shopping Cart
  • wpo
  • Data Protection
  • Components
  • Documents
Please enter at least one character to search
ALTER Laboratory Services
Servicio Familia Servicio Familia
Image
Image

DPA Test for Potentiometer

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

Fill the form to receive expert assistance from our skilled engineers and technicians

Read Policy

Related content

analysis of material

Material Analysis Techniques for Electronic Components

X-Ray Inspection applied to DPA test

DPA Test

Advances in Packaging and EEE Components

Destructive Physical Analysis (DPA) of EEE Components

Updates of ESCC 21001: Destructive Physical Analysis (DPA) of EEE Components

EEE Parts Results Page

DPA Test for Potentiometer

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

EEE Parts Results Page

Applications expected requirements
Category
Category
Recommended
More...
Close
  • Resistors
    • Potentiometer

117 results found for Potentiometer/Resistors

Reset
Part reference
Quality level / QPL
TOP
Package
Power Rating
Resistance [Nom]
Temperature Coefficient of Resistance
Tolerance
Unit price
Lead time

RT26C2W101
RT26 100R ±5% 250mW 50ppm/ºC Solder PIN
Bourns
MIL-PRF-27208/10

Compare DCL / BOM Cart
HIGH RELIABILITY STD.
Qualified
QPDSIS-27208
-55ºC to +150ºC
Through Hole Mount
Rectangular Solder PIN
0,250" SQ x 0,165" H
250mW
100R
±50ppm/ºC
±5%

RT12C2P501
RT12 500R ±5% 750mW 50ppm/ºC Solder PIN
Bourns
MIL-PRF-27208/8

Compare DCL / BOM Cart
HIGH RELIABILITY STD.
Qualified
QPDSIS-27208
-55ºC to +150ºC
Through Hole Mount
Rectangular Solder PIN
750mW
500R
±50ppm/ºC
±5%

RT22C2W103
RT22 10K0 ±5% 750mW 50ppm/ºC Solder PIN
Bourns
MIL-R-27208/4

Compare DCL / BOM Cart
HIGH RELIABILITY STD.
Qualified
QPDSIS-27208
-55ºC to +150ºC
Through Hole Mount
Rectangular Solder PIN
0,5" x 0,205" x 0,54" H
750mW
10K0
±50ppm/ºC
±5%

RT24C2P102
RT24 1K00 ±5% 750mW 50ppm/ºC Solder PIN
Bourns
MIL-PRF-27208/9

Compare DCL / BOM Cart
HIGH RELIABILITY STD.
Qualified
QPDSIS-27208
-55ºC to +150ºC
Through Hole Mount
Rectangular Solder PIN
0,375" SQ x 0,195" H
750mW
1K00
±50ppm/ºC
±5%

RT12C2L103
RT12 10K0 ±5% 750mW 50ppm/ºC Wire Leads
Bourns
MIL-PRF-27208/8

Compare DCL / BOM Cart
HIGH RELIABILITY STD.
Qualified
QPDSIS-27208
-55ºC to +150ºC
Point to Point Wiring
Rectangular Wire Leads
1,25" x 0,19" x 0,315" H
750mW
10K0
±50ppm/ºC
±5%

RT12C2P203
RT12 20K0 ±5% 750mW 50ppm/ºC Solder PIN
Bourns
MIL-PRF-27208/8

Compare DCL / BOM Cart
HIGH RELIABILITY STD.
Qualified
QPDSIS-27208
-55ºC to +150ºC
Through Hole Mount
Rectangular Solder PIN
750mW
20K0
±50ppm/ºC
±5%

RT22C2P103
RT22 10K0 ±5% 750mW 50ppm/ºC Solder PIN
Bourns
MIL-R-27208/4

Compare DCL / BOM Cart
HIGH RELIABILITY STD.
Qualified
QPDSIS-27208
-55ºC to +150ºC
Through Hole Mount
Rectangular Solder PIN
0,5" SQ x 0,235" H
750mW
10K0
±50ppm/ºC
±5%

RT24C2P200
RT24 20R0 ±5% 750mW 50ppm/ºC Solder PIN
Bourns
MIL-PRF-27208/9

Compare DCL / BOM Cart
HIGH RELIABILITY STD.
Qualified
QPDSIS-27208
-55ºC to +150ºC
Through Hole Mount
Rectangular Solder PIN
0,375" SQ x 0,195" H
750mW
20R0
±50ppm/ºC
±5%

RT26C2W201
RT26 200R ±5% 250mW 50ppm/ºC Solder PIN
Bourns
MIL-PRF-27208/10

Compare DCL / BOM Cart
HIGH RELIABILITY STD.
Qualified
QPDSIS-27208
-55ºC to +150ºC
Through Hole Mount
Rectangular Solder PIN
0,250" SQ x 0,165" H
250mW
200R
±50ppm/ºC
±5%

RT12C2Y203
RT12 20K0 ±5% 750mW 50ppm/ºC Solder PIN
Bourns
MIL-PRF-27208/8

Compare DCL / BOM Cart
HIGH RELIABILITY STD.
Qualified
QPDSIS-27208
-55ºC to +150ºC
Through Hole Mount
Rectangular Solder PIN
750mW
20K0
±50ppm/ºC
±5%
Part validation activities
Cost & Activity Matrix
  • <
  • 1
  • 2
  • 3
  • 4
  • 5
  • 6
  • 7
  • 8
  • 9
  • >
Alter Technology Laboratory Services
  • Screening
  • Evaluation/Qualification
  • Scanning Acoustic Microscopy
  • RF/Microwave
  • Incoming Inspection
  • DPA

EEE Components
  • Capacitors
  • Microcircuits
  • Resistors
  • Crystals and Oscillators
  • Schottky Barrier Rectifiers
  • Discretes

Laboratory Success Cases
  • GRACE Project
  • XRAY, SAM and Cross Section
  • SiC schottky Diode
  • JUICE Case
  • Deimos Neptuno
  • Melissa III

Company
  • About Us
  • Contact-us
  • How does doEEEt works?
Security & Privacity
  • Privacy Policy and Legal Notice
  • Copyright
  • Contact Clause
  • LinkedIn LinkedIn
  • Twitter Twitter
Copyright © 2025 ALTER TECHNOLOGY TÜV NORD S.A.U
All rights reserved.