Servicio Familia 
DPA Test for Phototransistor
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
DPA Test for Phototransistor
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
19 results found for Phototransistor/Transistor/Discretes
Part reference
Quality level / QPL
Package
TID (krads)
Unit price
Lead time
HIREL SCREENED
Not qualified
NOT LISTED IN QPL
Not Available
Pigtail
HIREL UNSCREENED
Not qualified
NOT LISTED IN QPL
Not Available
Pigtail
HIREL UNSCREENED
Not qualified
NOT LISTED IN QPL
Not Available
Pigtail
HIREL SCREENED
Not qualified
NOT LISTED IN QPL
Not Available
Pigtail
HIREL SCREENED
Not qualified
NOT LISTED IN QPL
Not Available
PILL PACK
HIREL UNSCREENED
Not qualified
NOT LISTED IN QPL
Not Available
PILL PACK
HIREL SCREENED
Not qualified
NOT LISTED IN QPL
Not Available
Pigtail
HIREL UNSCREENED
Not qualified
NOT LISTED IN QPL
Not Available
Pigtail
HIREL UNSCREENED
Not qualified
NOT LISTED IN QPL
Not Available
Pigtail
HIREL UNSCREENED
Not qualified
NOT LISTED IN QPL
Not Available
PILL PACK
Part validation activities
Cost & Activity Matrix