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DPA Test for Photodiode
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
DPA Test for Photodiode
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
1 results found for Photodiode/Diode/Discretes
Part reference
Quality level / QPL
Package
TID (krads)
Unit price
Lead time
ESCC
Not qualified
ESCC QPL
Through Hole Mount
TO-205AD (TO-39)
Part validation activities
Cost & Activity Matrix