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DPA Test for P-channel JFET

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

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EEE Parts Results Page

DPA Test for P-channel JFET

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

EEE Parts Results Page

Applications expected requirements
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  • Discretes
    • Transistor
      • FET
        • JFET
          • P-channel JFET

56 results found for P-channel JFET/JFET/FET/Transistor/Discretes

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Part reference
Quality level / QPL
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Package
Power Dissipation [Max]
TID (krads)
Drain Current [Max]
Drain-Source Voltage [Max]
Unit price
Lead time

JANTXV2N5114
2N5114 TO-206AA (TO-18)
Microsemi a Microchip Company
MIL-PRF-19500/476

Compare DCL / BOM Cart
JANTXV
Not qualified
QPDSIS-19500
-55ºC to +150ºC
Through Hole Mount
TO-206AA (TO-18)
500mW
90mA
30V

JANTXV2N5115UB
2N5115UB LCC-4 (UB)
Microsemi a Microchip Company
MIL-PRF-19500/476

Compare DCL / BOM Cart
JANTXV
Not qualified
QPDSIS-19500
-55ºC to +150ºC
Surface Mount
LCC-4 (UB)
500mW
60mA
30V

JANTX2N5116
2N5116 TO-206AA (TO-18)
Vishay Siliconix
MIL-PRF-19500/476

Compare DCL / BOM Cart
JANTX
Not qualified
QPDSIS-19500
-55ºC to +150ºC
Through Hole Mount
TO-206AA (TO-18)
500mW
25mA
30V

JANTXV2N5116UB
2N5116UB LCC-4 (UB)
VPT Components
MIL-PRF-19500/476

Compare DCL / BOM Cart
JANTXV
Qualified
QPDSIS-19500
-55ºC to +150ºC
Surface Mount
LCC-4 (UB)
500mW
25mA
30V

JAN2N5114
2N5114 TO-206AA (TO-18)
Microsemi a Microchip Company
MIL-PRF-19500/476

Compare DCL / BOM Cart
JAN
Not qualified
QPDSIS-19500
-55ºC to +150ºC
Through Hole Mount
TO-206AA (TO-18)
500mW
90mA
30V

JANTXV2N5115UB
2N5115UB LCC-4 (UB)
VPT Components
MIL-PRF-19500/476

Compare DCL / BOM Cart
JANTXV
Qualified
QPDSIS-19500
-55ºC to +150ºC
Surface Mount
LCC-4 (UB)
500mW
60mA
30V

JAN2N5114
2N5114 TO-206AA (TO-18)
VPT Components
MIL-PRF-19500/476

Compare DCL / BOM Cart
JAN
Qualified
QPDSIS-19500
-55ºC to +150ºC
Through Hole Mount
TO-206AA (TO-18)
500mW
90mA
30V

JANTX2N5116
2N5116 TO-206AA (TO-18)
Microsemi a Microchip Company
MIL-PRF-19500/476

Compare DCL / BOM Cart
JANTX
Not qualified
QPDSIS-19500
-55ºC to +150ºC
Through Hole Mount
TO-206AA (TO-18)
500mW
25mA
30V

JAN2N5114
2N5114 TO-206AA (TO-18)
Vishay Siliconix
MIL-PRF-19500/476

Compare DCL / BOM Cart
JAN
Not qualified
QPDSIS-19500
-55ºC to +150ºC
Through Hole Mount
TO-206AA (TO-18)
500mW
90mA
30V

JANTXV2N5116
2N5116 TO-206AA (TO-18)
Vishay Siliconix
MIL-PRF-19500/476

Compare DCL / BOM Cart
JANTXV
Not qualified
QPDSIS-19500
-55ºC to +150ºC
Through Hole Mount
TO-206AA (TO-18)
500mW
25mA
30V
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