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DPA Test for Other Interfaces ICs

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

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EEE Parts Results Page

DPA Test for Other Interfaces ICs

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

EEE Parts Results Page

Applications expected requirements
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  • Microcircuits
    • Communication-Interface
      • Other Interfaces

182 results found for Other Interfaces/Communication-Interface/Microcircuits

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Part reference
Quality level / QPL
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Package
Unit price
Lead time

IL712-1E
IL712-1E
NVE Corporation
MFR DS IL711/712/721

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +100ºC
Surface Mount
MSOP-8

IL711-3
IL711-3
NVE Corporation
MFR DS IL711/712/721

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +100ºC
Surface Mount
SOIC-8

5962F07A0602QXC
58035396-012
Honeywell Aerospace
5962-07A06

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
not available
Surface Mount
CQFP-68

VSC8541XMVRT-HP
VSC8541XMVRT-HP
Microchip Technology Nantes formerly Atmel
MFR DS DS60001602 EM

Compare DCL / BOM Cart
HIREL RT PLASTIC
Not qualified
NOT LISTED IN QPL
-40ºC to +125ºC
Surface Mount
VQFN-68

VSC8541WZBRT-SV
VSC8541WZBRT-SV
Microchip Technology Nantes formerly Atmel
MFR DS DS60001602

Compare DCL / BOM Cart
QML V EQ
Not qualified
NOT LISTED IN QPL
-40ºC to +125ºC
Surface Mount
CQFP-68

V62/12613-01XE
INA2134MDREP
Texas Instruments
V62/12613

Compare DCL / BOM Cart
EP
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
SOIC-14

5962-8874501FA
SNJ55115W
Texas Instruments
5962-88745

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-16

5962-9052201PA
DS1632J-8/883
Rochester
5962-90522

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-8

5962-9052201PA
QP1632/PA
Teledyne e2v Inc
5962-90522

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-8

5962-8874402EA
SNJ55114J
Texas Instruments
5962-88744

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16
Part validation activities
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