


DPA Test for Network Arrays Resistors
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
DPA Test for Network Arrays Resistors
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
401818 results found for Network Arrays/Resistors
Part reference
Quality level / QPL
Package
Power Rating
Resistance [Nom]
Temperature Coefficient of Resistance
Tolerance
Unit price
Lead time
ESCC
Qualified
ESCC QPL
Surface Mount
Chip
100mW
626K
±10ppm/ºC
±0,5%
ESCC
Qualified
ESCC QPL
Surface Mount
Chip
100mW
74K4
±10ppm/ºC
±0,5%
ESCC
Qualified
ESCC QPL
Surface Mount
Chip
100mW
684K
±10ppm/ºC
±0,5%
ESCC
Qualified
ESCC QPL
Surface Mount
Chip
100mW
6K17
±10ppm/ºC
±1%
ESCC
Qualified
ESCC QPL
Surface Mount
Chip
100mW
36K3
±10ppm/ºC
±0,5%
ESCC
Qualified
ESCC QPL
Surface Mount
Chip
100mW
918K
±10ppm/ºC
±1%
ESCC
Qualified
ESCC QPL
Surface Mount
Chip
100mW
685K
±10ppm/ºC
±0,5%
ESCC
Qualified
ESCC QPL
Surface Mount
Chip
100mW
999K
±10ppm/ºC
±0,5%
ESCC
Qualified
ESCC QPL
Surface Mount
Chip
100mW
84K3
±10ppm/ºC
±1%
ESCC
Qualified
ESCC QPL
Surface Mount
Chip