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DPA Test for N-channel JFET

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

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EEE Parts Results Page

DPA Test for N-channel JFET

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

EEE Parts Results Page

Applications expected requirements
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  • Discretes
    • Transistor
      • FET
        • JFET
          • N-channel JFET

306 results found for N-channel JFET/JFET/FET/Transistor/Discretes

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Part reference
Quality level / QPL
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Package
Power Dissipation [Max]
TID (krads)
Drain Current [Max]
Drain-Source Voltage [Max]
Unit price
Lead time

JAN2N4857UB
2N4857UB LCC-4 (UB)
Microsemi a Microchip Company
MIL-PRF-19500/385

Compare DCL / BOM Cart
JAN
Not qualified
QPDSIS-19500
-65ºC to +150ºC
Surface Mount
LCC-4 (UB)
400mW
100mA
40V

JAN2N4861
2N4861 TO-206AA (TO-18)
Vishay Siliconix
MIL-PRF-19500/385

Compare DCL / BOM Cart
JAN
Not qualified
QPDSIS-19500
-65ºC to +150ºC
Through Hole Mount
TO-206AA (TO-18)
360mW
80mA
30V

JANTX2N4860UB
2N4860UB LCC-4 (UB)
Microsemi a Microchip Company
MIL-PRF-19500/385

Compare DCL / BOM Cart
JANTX
Not qualified
QPDSIS-19500
-65ºC to +150ºC
Surface Mount
LCC-4 (UB)
400mW
100mA
30V

JANTX2N4093UB
2N4093UB LCC-4 (UB)
Microsemi a Microchip Company
MIL-PRF-19500/431

Compare DCL / BOM Cart
JANTX
Not qualified
QPDSIS-19500
-55ºC to +150ºC
Surface Mount
LCC-4 (UB)
360mW
8mA
40V

JANTX2N5546
2N5546 TO-71
VPT Components
MIL-PRF-19500/430

Compare DCL / BOM Cart
JANTX
Qualified
QPDSIS-19500
-65ºC to +150ºC
Through Hole Mount
TO-71
250mW
8mA

JANTX2N4856
2N4856 TO-206AA (TO-18)
Vishay Siliconix
MIL-PRF-19500/385

Compare DCL / BOM Cart
JANTX
Not qualified
QPDSIS-19500
-65ºC to +150ºC
Through Hole Mount
TO-206AA (TO-18)
360mW
175mA
40V

JAN2N4861
2N4861 TO-206AA (TO-18)
VPT Components
MIL-PRF-19500/385

Compare DCL / BOM Cart
JAN
Qualified
QPDSIS-19500
-65ºC to +150ºC
Through Hole Mount
TO-206AA (TO-18)
360mW
80mA
30V

JANTX2N3821
2N3821 TO-72
Microsemi a Microchip Company
MIL-PRF-19500/375

Compare DCL / BOM Cart
JANTX
Not qualified
QPDSIS-19500
-55ºC to +150ºC
Through Hole Mount
TO-72
300mW
2,5mA
50V

JAN2N4091UB
2N4091UB LCC-4 (UB)
Microsemi a Microchip Company
MIL-PRF-19500/431

Compare DCL / BOM Cart
JAN
Not qualified
QPDSIS-19500
-55ºC to +150ºC
Surface Mount
LCC-4 (UB)
360mW
30mA
40V

JAN2N4860UB
2N4860UB LCC-4 (UB)
VPT Components
MIL-PRF-19500/385

Compare DCL / BOM Cart
JAN
Qualified
QPDSIS-19500
-65ºC to +150ºC
Surface Mount
LCC-4 (UB)
400mW
100mA
30V
Part validation activities
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