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DPA Test for Multiple Diode Arrays

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

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EEE Parts Results Page

DPA Test for Multiple Diode Arrays

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

EEE Parts Results Page

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  • Discretes
    • Diode
      • Multiple Diode Arrays

36 results found for Multiple Diode Arrays/Diode/Discretes

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Part reference
Quality level / QPL
TOP
Package
TID (krads)
Average Output Rectified Current [Max]
Breakdown Voltage [Min]
Forward Surge Current [Max]
Forward Voltage [Max]
Time for Reverse Recovery [Max]
Unit price
Lead time

JANTX1N6507
1N6507 DIL-14
Microsemi a Microchip Company
MIL-PRF-19500/474

Compare DCL / BOM Cart
JANTX
Qualified
QPDSIS-19500
-55ºC to +150ºC
Through Hole Mount
DIL-14
300mA
60V
500mA
1V
20ns

JANTX1N5772
1N5772 FP-10
Microsemi a Microchip Company
MIL-PRF-19500/474

Compare DCL / BOM Cart
JANTX
Qualified
QPDSIS-19500
-55ºC to +150ºC
Surface Mount
FP-10
300mA
60V
500mA
1V
20ns

JANTXV1N6508
1N6508 DIL-14
Microsemi a Microchip Company
MIL-PRF-19500/474

Compare DCL / BOM Cart
JANTXV
Qualified
QPDSIS-19500
-55ºC to +150ºC
Through Hole Mount
DIL-14
300mA
60V
500mA
1V
20ns

JANTX1N6511
1N6511 DIL-14
Microsemi a Microchip Company
MIL-PRF-19500/474

Compare DCL / BOM Cart
JANTX
Qualified
QPDSIS-19500
-55ºC to +150ºC
Through Hole Mount
DIL-14
300mA
75V
500mA
1V
10ns

JANTXV1N6101
1N6101 DIL-16
Microsemi a Microchip Company
MIL-PRF-19500/474

Compare DCL / BOM Cart
JANTXV
Qualified
QPDSIS-19500
-55ºC to +150ºC
Through Hole Mount
DIL-16
300mA
75V
500mA
1V
10ns

JAN1N6510
1N6510 FP-16
Microsemi a Microchip Company
MIL-PRF-19500/474

Compare DCL / BOM Cart
JAN
Qualified
QPDSIS-19500
-55ºC to +150ºC
Surface Mount
FP-16
300mA
75V
500mA
1V
10ns

JAN1N6506
1N6506 DIL-14
Microsemi a Microchip Company
MIL-PRF-19500/474

Compare DCL / BOM Cart
JAN
Qualified
QPDSIS-19500
-55ºC to +150ºC
Through Hole Mount
DIL-14
300mA
60V
500mA
1V
20ns

JANTX1N6101
1N6101 DIL-16
Microsemi a Microchip Company
MIL-PRF-19500/474

Compare DCL / BOM Cart
JANTX
Qualified
QPDSIS-19500
-55ºC to +150ºC
Through Hole Mount
DIL-16
300mA
75V
500mA
1V
10ns

JANTXV1N6100
1N6100 FP-14
Microsemi a Microchip Company
MIL-PRF-19500/474

Compare DCL / BOM Cart
JANTXV
Qualified
QPDSIS-19500
-55ºC to +150ºC
Surface Mount
FP-14
300mA
75V
500mA
1V
10ns

JANTX1N6506
1N6506 DIL-14
Microsemi a Microchip Company
MIL-PRF-19500/474

Compare DCL / BOM Cart
JANTX
Qualified
QPDSIS-19500
-55ºC to +150ºC
Through Hole Mount
DIL-14
300mA
60V
500mA
1V
20ns
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