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DPA Test for Microcontroller

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

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EEE Parts Results Page

DPA Test for Microcontroller

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

EEE Parts Results Page

Applications expected requirements
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  • Microcircuits
    • Digital
      • Processor
        • Microcontroller

403 results found for Microcontroller/Processor/Digital/Microcircuits

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Part reference
Quality level / QPL
TOP
Package
TID (krads)
SEE (MeV/mg/cm2)
Clock Frequency [Max]
Number of Bits
Unit price
Lead time

ATmegaS64M1-KH-E
ATmegaS64M1-KH-E
Microchip Technology Nantes formerly Atmel
MFR DS DS60001506 EM

Compare DCL / BOM Cart
EM
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
CQFP-32
8MHz
8-Bits

SAM3X8ERT-DHB-MQ
SAM3X8ERT-DHB-MQ
Microchip Technology Nantes formerly Atmel
MFR DS DS60001614

Compare DCL / BOM Cart
QML Q EQ
Not qualified
NOT LISTED IN QPL
-40ºC to +105ºC
Surface Mount
CQFP-144
TID (HDR): 30.0
SEL (Let): 62.0
84MHz
32-Bits

5962-9157702MXA
87C752-16/BXA
Teledyne e2v Inc
5962-91577

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-28
16MHz
8-Bits

5962-8768407MMA
QP87C51/BMA OTP
Teledyne e2v Inc
5962-87684

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQCC-44 (J-Lead)
12MHz
8-Bits

V62/13629-01XF
TMS5703137CZWTQEP
Texas Instruments
V62/13629

Compare DCL / BOM Cart
EP
Not qualified
NOT LISTED IN QPL
-40ºC to +125ºC
Surface Mount
PBGA-337
180MHz
16/32-Bits

5962-9150102MXA
TS68332MAB/C20A
Teledyne e2v Semiconductors
5962-91501

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQFP-132 (Gull Wing)
20,97MHz
32-Bits

5962-8768408MQA
87C51-16/BQA OTP
Teledyne e2v Inc
5962-87684

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-40
16MHz
8-Bits

5962-8506401MXA
QP80C31BH/BUA
Teledyne e2v Inc
85064

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-44
12MHz
8-Bits

V62/12622-01YF
S5LS20206ASGWTMEP
Texas Instruments
V62/12622

Compare DCL / BOM Cart
EP
Not qualified
NOT LISTED IN QPL
Surface Mount
PBGA-337
160MHz
16/32-Bits

5962-8768402MMA
87C51-16/BMA
Rochester
5962-87684

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQCC-44 (J-Lead)
16MHz
8-Bits
Part validation activities
Cost & Activity Matrix
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