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DPA Test for Microcontroller
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
DPA Test for Microcontroller
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
403 results found for Microcontroller/Processor/Digital/Microcircuits
Part reference
Quality level / QPL
Package
TID (krads)
SEE (MeV/mg/cm2)
Clock Frequency [Max]
Number of Bits
Unit price
Lead time
EM
Not qualified
NOT LISTED IN QPL
Surface Mount
CQFP-32
8MHz
8-Bits
QML Q EQ
Not qualified
NOT LISTED IN QPL
Surface Mount
CQFP-144
TID (HDR): 30.0
SEL (Let): 62.0
84MHz
32-Bits
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-28
16MHz
8-Bits
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQCC-44 (J-Lead)
12MHz
8-Bits
EP
Not qualified
NOT LISTED IN QPL
Surface Mount
PBGA-337
180MHz
16/32-Bits
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQFP-132 (Gull Wing)
20,97MHz
32-Bits
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-40
16MHz
8-Bits
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQLCC-44
12MHz
8-Bits
EP
Not qualified
NOT LISTED IN QPL
Surface Mount
PBGA-337