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DPA Test for MRAM Memory
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
DPA Test for MRAM Memory
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
164 results found for MRAM/RAM/Memory/Digital/Microcircuits
Part reference
Quality level / QPL
Package
TID (krads)
SEE (MeV/mg/cm2)
Access Time [Max]
Memory Size
Unit price
Lead time
INDUSTRIAL
Not qualified
NOT LISTED IN QPL
Surface Mount
SOP-64
250ns
5M (128K x 40)
EM
Not qualified
NOT LISTED IN QPL
Surface Mount
SOP-64
250ns
8M (256K x 32)
SPACE
Not qualified
NOT LISTED IN QPL
Surface Mount
SOP-84
TID (HDR): 50.0
SEL (Let): 75.0
35ns
20M (512K x 40)
EM
Not qualified
NOT LISTED IN QPL
Surface Mount
SOP-84
35ns
20M (512K x 40)
INDUSTRIAL
Not qualified
NOT LISTED IN QPL
Surface Mount
SOP-64
250ns
4M (128K x 32)
EM
Not qualified
NOT LISTED IN QPL
Surface Mount
SOP-64
250ns
4M (128K x 32)
INDUSTRIAL
Not qualified
NOT LISTED IN QPL
Surface Mount
SOP-96
35ns
10M (256K x 40)
QML Q+
Qualified
QPDSIS-38535
Surface Mount
CFP-40
TID (HDR): 100.0
SEL (Let): 111.0
45 ns
16M(2M x 8)
QML Q+
Not qualified
QPDSIS-38535
Surface Mount
CFP-40
TID (HDR): 300.0
SEL (Let): 111.0
45 ns
16M(2M x 8)
QML Q+
Not qualified
QPDSIS-38535
Surface Mount
CFP-40
TID (HDR): 500.0
SEL (Let): 111.0
45 ns
16M (2M x 8)
Part validation activities
Cost & Activity Matrix