


DPA Test for MOSFET Drivers
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
DPA Test for MOSFET Drivers
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
210 results found for MOSFET Drivers/Driver/Power Management/Microcircuits
Part reference
Quality level / QPL
Package
TID (krads)
SEE (MeV/mg/cm2)
Delay Time [Max]
Fall Time [Max]
Output Current [Max]
Rise Time [Max]
Unit price
Lead time
COMMERCIAL
Not qualified
NOT LISTED IN QPL
GOLD
Surface Mount
SOIC-8
55ns
50ns
12A
40ns
COMMERCIAL
Not qualified
NOT LISTED IN QPL
GOLD
Surface Mount
SOIC-8
55ns
50ns
12A
40ns
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
SOIC-8
100ns
35ns
3A
35ns
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
WSON-6
25ns
5ns
6A
5ns
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
SOIC-8
100ns
35ns
3A
35ns
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
SOIC-16
95ns
25ns
1,5A
20ns
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
SOIC-16
13,5ns
13ns
2A
13,5ns
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
SOIC-8
40ns
25ns
5A
25ns
883
Not qualified
NOT LISTED IN QPL
Surface Mount
CQLCC-20