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DPA Test for MOS Capacitors
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
DPA Test for MOS Capacitors
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
188 results found for Semiconductor Capacitors/Capacitors
Part reference
Quality level / QPL
Package
Capacitance [Nom]
DC Rated Voltage
Tolerance
Unit price
Lead time
ESCC
Qualified
ESCC QPL
DIE
DIE
15pF
200V
±10%
ESCC
Qualified
ESCC QPL
DIE
DIE
12pF
100V
±10%
ESCC
Qualified
ESCC QPL
DIE
DIE
33pF
100V
±10%
ESCC
Qualified
ESCC QPL
DIE
DIE
6,8pF
200V
±10%
ESCC
Qualified
ESCC QPL
DIE
DIE
0,33pF
200V
±10%
ESCC
Qualified
ESCC QPL
DIE
DIE
1pF
200V
±20%
ESCC
Qualified
ESCC QPL
DIE
DIE
10pF
40V
±20%
ESCC
Qualified
ESCC QPL
DIE
DIE
8,2pF
40V
±10%
ESCC
Qualified
ESCC QPL
DIE
DIE
39pF
40V
±10%
ESCC
Qualified
ESCC QPL
DIE
DIE
0,82pF
200V
±20%
Part validation activities
Cost & Activity Matrix