


DPA Test for Logic SCAN ICs
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
DPA Test for Logic SCAN ICs
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
41 results found for SCAN/Logic/Digital/Microcircuits
Part reference
Quality level / QPL
Package
Type
TID (krads)
SEE (MeV/mg/cm2)
Number of Bits
Unit price
Lead time
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-24
Transceiver
8-Bits
QML Q
Not qualified
QPDSIS-38535
Surface Mount
CQLCC-28
Transceiver/Register
8-Bits
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQFP-68
Transceiver
18-Bits
QML Q
Not qualified
QPDSIS-38535
Surface Mount
CQLCC-28
Register
8-Bits
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQLCC-28
Inverting Buffer
8-Bits
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-28
4-Bits
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-24
Inverting Buffer
8-Bits
QML Q
Qualified
QPDSIS-38535
Surface Mount
CFP-56
D-Type Flip Flop
9-Bits
QML Q
Not qualified
QPDSIS-38535
Surface Mount
CQFP-68
Transceiver/Register
18-Bits
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQFP-68
Transceiver
18-Bits
Part validation activities
Cost & Activity Matrix