


DPA Test for Logic SCAN ICs
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
DPA Test for Logic SCAN ICs
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
41 results found for SCAN/Logic/Digital/Microcircuits
Part reference
Quality level / QPL
Package
Type
TID (krads)
SEE (MeV/mg/cm2)
Number of Bits
Unit price
Lead time
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQLCC-28
Transceiver
8-Bits
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-24
D-Type Flip Flop
8-Bits
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQLCC-28
D-Type Flip Flop
8-Bits
QML Q
Qualified
QPDSIS-38535
Surface Mount
CFP-56
Transparent Latch
9-Bits
QML Q
Qualified
QPDSIS-38535
Surface Mount
CFP-56
Transceiver
9-Bits
QML Q
Not qualified
QPDSIS-38535
Surface Mount
CFP-24
Transceiver
10-Bits
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-24
Transceiver
8-Bits
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQLCC-28
D-Type Latch
8-Bits
QML Q
Not qualified
QPDSIS-38535
Surface Mount
CQFP-68
Transceiver/Register
18-Bits
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQLCC-28
Transceiver
8-Bits
Part validation activities
Cost & Activity Matrix