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DPA Test for Logic SCAN ICs

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

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EEE Parts Results Page

DPA Test for Logic SCAN ICs

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

EEE Parts Results Page

Applications expected requirements
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  • Microcircuits
    • Digital
      • Logic
        • SCAN

41 results found for SCAN/Logic/Digital/Microcircuits

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Part reference
Quality level / QPL
TOP
Package
Type
TID (krads)
SEE (MeV/mg/cm2)
Number of Bits
Unit price
Lead time

5962-9461501Q3A
SNJ54ABT8543FK
Texas Instruments
5962-94615

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-28
Transceiver
8-Bits

5962-9172701QLA
SNJ54BCT8374AJT
Texas Instruments
5962-91727

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-24
D-Type Flip Flop
8-Bits

5962-9172701Q3A
SNJ54BCT8374AFK
Texas Instruments
5962-91727

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-28
D-Type Flip Flop
8-Bits

5962-9311801MXA
SCAN18373T/MXA
Rochester
5962-93118

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-56
Transparent Latch
9-Bits

5962-9311501MXA
SCAN18245T/MXA
Rochester
5962-93115

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-56
Transceiver
9-Bits

5962-9681201QKA
SNL54ABT8996W
Texas Instruments
5962-96812

Compare DCL / BOM Cart
QML Q
Not qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-24
Transceiver
10-Bits

5962-9318601MLA
SNJ54ABT8245JT
Texas Instruments
5962-93186

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-24
Transceiver
8-Bits

5962-9172501M3A
SNJ54BCT8373AFK
Texas Instruments
5962-91725

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-28
D-Type Latch
8-Bits

5962-9669801QXA
SNJ54ABTH18646AHV
Texas Instruments
5962-96698

Compare DCL / BOM Cart
QML Q
Not qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQFP-68
Transceiver/Register
18-Bits

5962-9172801Q3A
SNJ54BCT8245AFK
Texas Instruments
5962-91728

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-28
Transceiver
8-Bits
Part validation activities
Cost & Activity Matrix
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