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DPA Test for Logic Register ICs

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

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EEE Parts Results Page

DPA Test for Logic Register ICs

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

EEE Parts Results Page

Applications expected requirements
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  • Microcircuits
    • Digital
      • Logic
        • Register

877 results found for Register/Logic/Digital/Microcircuits

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Part reference
Quality level / QPL
TOP
Package
3-State Outputs
Type
TID (krads)
SEE (MeV/mg/cm2)
Number of Bits
Number of Channels
Unit price
Lead time

5962-9221606MSA
IDT54FCT299CTEB
Teledyne e2v Inc
5962-92216

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-20
With
Shift Register
8-Bits
1

M38510/05754BEA
CD4021BFB
Texas Instruments
MIL-M-38510/57

Compare DCL / BOM Cart
JAN B
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16
Without
Shift Register
8-Bits
1

5962-8855701EA
SL10541/BEA
Lansdale
5962-88557

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16
Without
Shift Register
4-Bits
1

5962-90503012A
SNJ54LS396FK
Texas Instruments
5962-90503

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20
Without
Storage Register
8-Bits
1

M38510/01801BFA
SL54170/BFA
Lansdale
MIL-M-38510/18

Compare DCL / BOM Cart
JAN B
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-16
Without
4-by-4 Register File
16-Bits
1

M38510/00903BAA
54164/BAA
Rochester
MIL-M-38510/9

Compare DCL / BOM Cart
JAN B
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-14
Without
Shift Register
8-Bits
1

5962-9050101QEA
SNJ54HC166J
Texas Instruments
5962-90501

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16
Without
Shift Register
8-Bits
1

M38510/00904BFA
JD54165BFA
Teledyne e2v Inc
MIL-M-38510/9

Compare DCL / BOM Cart
JAN B
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-16
Without
Shift Register
8-Bits
1

5962-9223604MRA
P54FCT534TCMB04
Pyramid Semiconductor
5962-92236

Compare DCL / BOM Cart
QML M
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-20

7702501EA
CD4094BF3A
Texas Instruments
77025

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16
With
Shift Register
8-Bits
1
Part validation activities
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