


DPA Test for Logic Latch ICs
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
DPA Test for Logic Latch ICs
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
767 results found for Latch/Logic/Digital/Microcircuits
Part reference
Quality level / QPL
Package
Type
TID (krads)
SEE (MeV/mg/cm2)
Delay Time [Max]
Number of Bits
Output Type
Unit price
Lead time
QML Q
Qualified
QPDSIS-38535
Surface Mount
CFP-48
D-Type
7,1ns
16-Bits
Non-Inverting
883
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
D-Type
9,5ns
8-Bits
JAN B
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
D-Type
46ns
4-Bits
Inverting,Non-Inverting
JAN B
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
D-Type
27ns
8-Bits
Inverting
JAN B
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
Addressable Latch
46ns
8-Bits
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
D-Type
6,7ns
8-Bits
Non-Inverting
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
D-Type
15ns
8-Bits
Non-Inverting
QML V
Not qualified
QPDSIS-38535
Surface Mount
CFP-20
D-Type
175ns
8-Bits
Non-Inverting
QML Q
Qualified
QPDSIS-38535
Surface Mount
CFP-20
D-Type
15ns
8-Bits
Non-Inverting
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20