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DPA Test for Instrumentation Amplifier

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

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EEE Parts Results Page

DPA Test for Instrumentation Amplifier

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

EEE Parts Results Page

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  • Microcircuits
    • Signal Acquisition-Conditioning
      • Amplifier
        • Instrumentation

36 results found for Instrumentation/Amplifier/Signal Acquisition-Conditioning/Microcircuits

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Part reference
Quality level / QPL
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Package
Unit price
Lead time

V62/12646-01YE
AD8231TCPZ-EP-R7
Analog Devices
V62/12646

Compare DCL / BOM Cart
EP
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
LFCSP-16

5962L1420502VXA
AD8229AF/QMLL
Analog Devices
5962-14205

Compare DCL / BOM Cart
QML V
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-14

AMP01-000C
AMP01-000C
Analog Devices
MFR SPEC ASD0012820

Compare DCL / BOM Cart
SPACE
Not qualified
ADI Space QPL
-55ºC to +125ºC
DIE
DIE

5962-8863003VVA
AMP01D/QMLV
Analog Devices
5962-88630

Compare DCL / BOM Cart
QML V
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-18

V62/16619-01XE
AD8221TRMZ-EP
Analog Devices
V62/16619

Compare DCL / BOM Cart
EP
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
MSOP-8

5962R8853901V2A
AD524SE/QMLR
Analog Devices
5962-88539

Compare DCL / BOM Cart
QML V
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20

AD524SE/883B
AD524SE/883B
Analog Devices
QML_AD524_AND_DS

Compare DCL / BOM Cart
883
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20

5962-8863001VVA
AMP01AD/QMLV
Analog Devices
5962-88630

Compare DCL / BOM Cart
QML V
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-18

V62/12646-01XE
AD8231TCPZ-EP-R7
Analog Devices
V62/12646

Compare DCL / BOM Cart
EP
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
LFCSP-16

5962-8863003V3A
AMP01TC/QMLV
Analog Devices
5962-88630

Compare DCL / BOM Cart
QML V
Not qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-28
Part validation activities
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