Servicio Familia 
DPA Test for HEMT Transistors
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
DPA Test for HEMT Transistors
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
103 results found for HEMT/FET/Transistor/Discretes
Part reference
Quality level / QPL
Package
Power Dissipation [Max]
TID (krads)
Drain Current [Max]
Drain-Source Voltage [Max]
Unit price
Lead time
JANS
Not qualified
NOT LISTED IN QPL
Surface Mount
LCC-4
TID (HDR): 1000.0
8A
40V
HIREL SCREENED
Not qualified
NOT LISTED IN QPL
Surface Mount
LCC-4
TID (HDR): 1000.0
30A
40V
JANS
Not qualified
NOT LISTED IN QPL
Surface Mount
LCC-4
TID (HDR): 100.0
18A
200V
PROTO
Not qualified
NOT LISTED IN QPL
Evaluation Board
Evaluation Board
60A
100V
JANS
Not qualified
NOT LISTED IN QPL
Surface Mount
LCC-4
TID (HDR): 100.0
4A
300V
HIREL SCREENED
Not qualified
NOT LISTED IN QPL
Surface Mount
LCC-4
TID (HDR): 300.0
4A
300V
JANS
Not qualified
NOT LISTED IN QPL
Surface Mount
LCC-4
TID (HDR): 100.0
30A
40V
EM
Not qualified
NOT LISTED IN QPL
Surface Mount
LCC-4
4A
300V
HIREL SCREENED
Not qualified
NOT LISTED IN QPL
Surface Mount
LCC-4