Skip to Content
  • Resources
    • COTS For Space WEBINARS
    • EEE Components
    • SPECIFICATIONS / QPLs
    • Events / Webinars
    • Space Talks
    • Tech Articles
    • Manufacturer Notifications
  • Laboratory Services
    • Laboratory Standard Testing
    • Non Standard Testing
    • Silicon Carbide -SiC- Diodes
    • CrowdTesting
    • Optoelectronics
    • Small Sats
    • Representative Projects / Papers
  • Additional Services
    • Industry 4.0 Cybersecurity (IEC 62443) NEW
    • Penetration Test NEW
    • Cybersecurity Certified (CSC) NEW
    • Code Score Matrix NEW
    • Long-term storage of wafers
    • Electronic Design
  • Tools
    • Comparator
    • MYDCLs / BOMs
    • esa-stockplace
  • About Us
  • Proposal Next
  • Sign In
Cookies on the doEEEt website. We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we'll assume that you are happy to receive all cookies on the doEEEt website. However, if you would like to, you can change your cookie settings at any time. Link to cookies policy.
doEEEt DPA Test for Gate Drive Transformers | doEEEt.com
  • Home
  • How does doEEEt works
  • About us
  • Contact Us
  • Terms of Use
  • Disclaimer
  • Privacy Policy
  • Privacy Policy and Legal Notice
  • Cookie Policy
  • Copyright
  • autosignup2
  • Instant Quote
  • Introducing NanoXplore And Its European FPGA’s ITAR Free
  • Space Talks 3 - Dan Friedlander
  • autosignup3
  • Shopping Cart
  • wpo
  • Data Protection
  • Components
  • Documents
Please enter at least one character to search
ALTER Laboratory Services
Servicio Familia Servicio Familia
Image
Image

DPA Test for Gate Drive Transformers

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

Fill the form to receive expert assistance from our skilled engineers and technicians

Read Policy

Related content

analysis of material

Material Analysis Techniques for Electronic Components

X-Ray Inspection applied to DPA test

DPA Test

Advances in Packaging and EEE Components

Destructive Physical Analysis (DPA) of EEE Components

Updates of ESCC 21001: Destructive Physical Analysis (DPA) of EEE Components

EEE Parts Results Page

DPA Test for Gate Drive Transformers

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

EEE Parts Results Page

Applications expected requirements
Category
Category
Recommended
More...
Close
  • Transformers
    • Gate Drive Transformers

44 results found for Gate Drive Transformers/Transformers

Reset
Part reference
Quality level / QPL
TOP
Package
Turns Ratio
Volt-Time Product
Unit price
Lead time

14890601-B
Series 1489 1:1:1:1:1 639uH ±25% RM4-ILP
Flux
MFR DS 04970006

Compare DCL / BOM Cart
CLASS B EQ
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
RM4-ILP Core
(14 x 17) mm
1:1:1:1:1
127,6V-us

14891103-M
Series 1489 1:2:2 458uH ±25% RM5-ILP
Flux
MFR DS 04970005

Compare DCL / BOM Cart
MIL/HiREL
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
RM5-ILP Core
(14,15 x 18,7) mm
1:2:2
127V-us

14890602-M
Series 1489 2:1:1:1:1 2,5mH ±25% RM4-ILP
Flux
MFR DS 04970006

Compare DCL / BOM Cart
MIL/HiREL
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
RM4-ILP Core
(14 x 17) mm
2:1:1:1:1
255,2V-us

320101301F14890001
Series 1489 1:1:1 360uH ±25% EP5 Core
Flux
ESCC 3201/013 - Gate Drive

Compare DCL / BOM Cart
ESCC
Qualified
ESCC QPL
-55ºC to +125ºC
Surface Mount
EP5 Core
(6,85 x 7,7) mm
1:1:1
36V-us

14890603-S
Series 1489 1:2:2:2:2 160uH ±25% RM4-ILP
Flux
MFR DS 04970006

Compare DCL / BOM Cart
CLASS S EQ
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
RM4-ILP Core
(14 x 17) mm
1:2:2:2:2
63,8V-us

14890204-B
Series 1489 2:1:1 777uH ±25% ER9.5 Core
Flux
MFR DS 04970004

Compare DCL / BOM Cart
CLASS B EQ
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
ER9.5 Core
(9,9 x 11,7) mm
2:1:1
88V-us

14890603-B
Series 1489 1:2:2:2:2 160uH ±25% RM4-ILP
Flux
MFR DS 04970006

Compare DCL / BOM Cart
CLASS B EQ
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
RM4-ILP Core
(14 x 17) mm
1:2:2:2:2
63,8V-us

14890204-M
Series 1489 2:1:1 777uH ±25% ER9.5 Core
Flux
MFR DS 04970004

Compare DCL / BOM Cart
MIL/HiREL
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
ER9.5 Core
(9,9 x 11,7) mm
2:1:1
88V-us

320101301F14890601
Series 1489 1:1:1:1:1 639uH ±25% RM4-ILP
Flux
ESCC 3201/013 - Gate Drive

Compare DCL / BOM Cart
ESCC
Qualified
ESCC QPL
-55ºC to +125ºC
Surface Mount
RM4-ILP Core
(14 x 17) mm
1:1:1:1:1
127,6V-us

320101301F14890203
Series 1489 1:2:2 194uH ±25% ER9.5 Core
Flux
ESCC 3201/013 - Gate Drive

Compare DCL / BOM Cart
ESCC
Qualified
ESCC QPL
-55ºC to +125ºC
Surface Mount
ER9.5 Core
(9,9 x 11,7) mm
1:2:2
44V-us
Part validation activities
Cost & Activity Matrix
  • <
  • 1
  • 2
  • 3
  • >
Alter Technology Laboratory Services
  • Screening
  • Evaluation/Qualification
  • Scanning Acoustic Microscopy
  • RF/Microwave
  • Incoming Inspection
  • DPA

EEE Components
  • Capacitors
  • Microcircuits
  • Resistors
  • Crystals and Oscillators
  • Schottky Barrier Rectifiers
  • Discretes

Laboratory Success Cases
  • GRACE Project
  • XRAY, SAM and Cross Section
  • SiC schottky Diode
  • JUICE Case
  • Deimos Neptuno
  • Melissa III

Company
  • About Us
  • Contact-us
  • How does doEEEt works?
Security & Privacity
  • Privacy Policy and Legal Notice
  • Copyright
  • Contact Clause
  • LinkedIn LinkedIn
  • Twitter Twitter
Copyright © 2025 ALTER TECHNOLOGY TÜV NORD S.A.U
All rights reserved.