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DPA Test for Film Resistors

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

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EEE Parts Results Page

DPA Test for Film Resistors

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

EEE Parts Results Page

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  • Resistors
    • Film

17121749 results found for Film/Resistors

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Part reference
Quality level / QPL
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Package
Power Rating
Resistance [Nom]
Temperature Coefficient of Resistance
Tolerance
Unit price
Lead time

400101603C5230F4
CHP 0505 523R 1% 125mW 100ppm/ºC Chip
Vishay Sfernice
ESCC 4001/016

Compare DCL / BOM Cart
ESCC C
Not qualified
ESCC QPL
-55ºC to +155ºC
Surface Mount
Chip
0505 (1412 Metric)
125mW
523R
±100ppm/ºC
±1%

400100101B5232D3
RNC55 52K3 0,5% 100mW 50ppm/ºC Axial
Vishay Sfernice
ESCC 4001/001

Compare DCL / BOM Cart
ESCC B
Not qualified
ESCC QPL
-55ºC to +175ºC
Through Hole Mount
Axial
-
100mW
52K3
50ppm/ºC
±0,5%

400102002C6653F4
CHP 1206 665K 1% 250mW 100ppm/ºC Chip
Vishay Sfernice
ESCC 4001/020

Compare DCL / BOM Cart
ESCC C
Not qualified
ESCC QPL
-55ºC to +155ºC
Surface Mount
Chip
1206 (3216 Metric)
250mW
665K
±100ppm/ºC
±1%

400100101B5R62D3
RNC55 5R62 0,5% 100mW 50ppm/ºC Axial
Vishay Sfernice
ESCC 4001/001

Compare DCL / BOM Cart
ESCC B
Not qualified
ESCC QPL
-55ºC to +175ºC
Through Hole Mount
Axial
-
100mW
5R62
50ppm/ºC
±0,5%

400100301C3320F3
RNC65 332R 1% 250mW 50ppm/ºC Axial
Vishay Sfernice
ESCC 4001/003

Compare DCL / BOM Cart
ESCC C
Not qualified
ESCC QPL
-55ºC to +175ºC
Through Hole Mount
Axial
-
250mW
332R
50ppm/ºC
±1%

400101702C8870F4
CHP 0705 887R 1% 200mW 100ppm/ºC Chip
Vishay Sfernice
ESCC 4001/017

Compare DCL / BOM Cart
ESCC C
Not qualified
ESCC QPL
-55ºC to +155ºC
Surface Mount
Chip
0705 (1712 Metric)
200mW
887R
±100ppm/ºC
±1%

400101801C2942F4
CHP 0805 29K4 1% 200mW 100ppm/ºC Chip
Vishay Sfernice
ESCC 4001/018

Compare DCL / BOM Cart
ESCC C
Not qualified
ESCC QPL
-55ºC to +155ºC
Surface Mount
Chip
0805 (2012 Metric)
200mW
29K4
±100ppm/ºC
±1%

400101601C1781G4
CHP 0505 1K78 2% 125mW 100ppm/ºC Chip
Vishay Sfernice
ESCC 4001/016

Compare DCL / BOM Cart
ESCC C
Not qualified
ESCC QPL
-55ºC to +155ºC
Surface Mount
Chip
0505 (1412 Metric)
125mW
1K78
±100ppm/ºC
±2%

400100201C1053F1
RNC60 105K 1% 125mW 10ppm/ºC Axial
Vishay Sfernice
ESCC 4001/002

Compare DCL / BOM Cart
ESCC C
Not qualified
ESCC QPL
-55ºC to +175ºC
Through Hole Mount
Axial
-
125mW
105K
±10ppm/ºC
±1%

400100201B3012D1
RNC60 30K1 0,5% 125mW 10ppm/ºC Axial
Vishay Sfernice
ESCC 4001/002

Compare DCL / BOM Cart
ESCC B
Not qualified
ESCC QPL
-55ºC to +175ºC
Through Hole Mount
Axial
-
125mW
30K1
±10ppm/ºC
±0,5%
Part validation activities
Cost & Activity Matrix
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