


DPA Test for Film Capacitors
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
DPA Test for Film Capacitors
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
98139 results found for Film Capacitors/Capacitors
Part reference
Quality level / QPL
Package
Capacitance [Nom]
DC Rated Voltage
Tolerance
Unit price
Lead time
FAILURE RATE M
Qualified
QPDSIS-83421
Through Hole Mount
Axial
180nF
200V
±10%
FAILURE RATE R
Not qualified
QPDSIS-83421
Through Hole Mount
Axial
15nF
30V
±2%
FAILURE RATE P
Qualified
QPDSIS-83421
Through Hole Mount
Axial
5nF
200V
±10%
FAILURE RATE R
Qualified
QPDSIS-83421
Through Hole Mount
Axial
50nF
400V
±0,25%
FAILURE RATE M
Qualified
QPDSIS-83421
Through Hole Mount
Axial
680nF
100V
±2%
FAILURE RATE M
Qualified
QPDSIS-83421
Through Hole Mount
Axial
10nF
400V
±10%
FAILURE RATE P
Not qualified
QPDSIS-83421
Through Hole Mount
Axial
2,7nF
200V
±0,5%
FAILURE RATE R
Qualified
QPDSIS-83421
Through Hole Mount
Axial
56nF
400V
±0,5%
FAILURE RATE R
Qualified
QPDSIS-83421
Through Hole Mount
Axial
2uF
50V
±0,5%
FAILURE RATE S
Qualified
QPDSIS-83421
Through Hole Mount
Axial
56nF
30V
±0,25%
Part validation activities
Cost & Activity Matrix