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DPA Test for Fast Recovery Rectifier

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

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EEE Parts Results Page

DPA Test for Fast Recovery Rectifier

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

EEE Parts Results Page

Applications expected requirements
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  • Discretes
    • Diode
      • Rectifier
        • Fast Recovery

7550 results found for Fast Recovery/Rectifier/Diode/Discretes

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Part reference
Quality level / QPL
TOP
Package
TID (krads)
Average Output Rectified Current [Max]
Forward Surge Current [Max]
Forward Voltage [Max]
Time for Reverse Recovery [Max]
Working Peak Reverse Voltage [Max]
Unit price
Lead time

1N3880
1N3880 DO-203AA (DO-4)
Solid State Devices Inc
MFR DS RF0003

Compare DCL / BOM Cart
HIGH RELIABILITY
Not qualified
NOT LISTED IN QPL
-65ºC to +150ºC
Point to Point Wiring
DO-203AA (DO-4)
6A
150A
1,1V
120ns
100V

JANTXV1N6773R
1N6773R TO-257AA
Microsemi a Microchip Company
MIL-PRF-19500/645

Compare DCL / BOM Cart
JANTXV
Qualified
QPDSIS-19500
-55ºC to +100ºC
Through Hole Mount
TO-257AA
8A
60A
1,6V
60ns
600V

SED30KE600
SED30KE600 Sedpack 2 (KE)
Solid State Devices Inc
MFR DS RC0044

Compare DCL / BOM Cart
HIGH RELIABILITY
Not qualified
NOT LISTED IN QPL
-55ºC to +150ºC
Surface Mount
Sedpack 2 (KE)
30A
300A
1,3V
35ns
600V

JANTXV1N5816R
1N5816R DO-203AA (DO-4)
Microsemi a Microchip Company
MIL-PRF-19500/478

Compare DCL / BOM Cart
JANTXV
Qualified
QPDSIS-19500
-65ºC to +100ºC
Point to Point Wiring
DO-203AA (DO-4)
20A
400A
0,95V
35ns
150V

JANS1N6620US
1N6620US Melf A (US)
Sensitron
MIL-PRF-19500/585

Compare DCL / BOM Cart
JANS
Qualified
QPDSIS-19500
-65ºC to +150ºC
Surface Mount
Melf A (US)
1,2A
20A
1,6V
30ns
200V

SDR312
SDR312 DO-203AB (DO-5)
Solid State Devices Inc
MFR DS RU0023

Compare DCL / BOM Cart
HIGH RELIABILITY
Not qualified
NOT LISTED IN QPL
-65ºC to +175ºC
Point to Point Wiring
DO-203AB (DO-5)
30A
275A
900mV
50ns
125V

JANTX1N5615US
1N5615US Melf A (US)
Sensitron
MIL-PRF-19500/429

Compare DCL / BOM Cart
JANTX
Qualified
QPDSIS-19500
-55ºC to +125ºC
Surface Mount
Melf A (US)
1A
25A
1,6V
150ns
200V

JAN1N3893
1N3893 DO-203AA (DO-4)
Microsemi a Microchip Company
MIL-PRF-19500/304

Compare DCL / BOM Cart
JAN
Qualified
QPDSIS-19500
-65ºC to +150ºC
Point to Point Wiring
DO-203AA (DO-4)
12A
175A
2,75V
200ns
400V

JANTXV1N5802US
1N5802US Melf A (US)
VPT Components
MIL-PRF-19500/477

Compare DCL / BOM Cart
JANTXV
Not qualified
QPDSIS-19500
-65ºC to +125ºC
Surface Mount
Melf A (US)
1A
35A
0,975V
25ns
50V

SDR705
SDR705 DO-203AB (DO-5)
Solid State Devices Inc
MFR DS RU0057

Compare DCL / BOM Cart
HIGH RELIABILITY
Not qualified
NOT LISTED IN QPL
-55ºC to +175ºC
Point to Point Wiring
DO-203AB (DO-5)
70A
750A
975mV
50ns
50V
Part validation activities
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