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DPA Test for Digital Signal Processor

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

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EEE Parts Results Page

DPA Test for Digital Signal Processor

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

EEE Parts Results Page

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  • Microcircuits
    • Digital
      • Processor
        • Digital Signal Processor

111 results found for Digital Signal Processor/Processor/Digital/Microcircuits

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Part reference
Quality level / QPL
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Package
Unit price
Lead time

5962-9866102VXA
SMV320C6701GLPM14
Texas Instruments
5962-98661

Compare DCL / BOM Cart
QML V
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CBGA-429

5962-0053901QYC
SMJ320VC33HFGM150
Texas Instruments
5962-00539

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQFP-164

5962-9466903QXC
SMJ320C40GFM50
Texas Instruments
5962-94669

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CPGA-325

V62/06619-03XE
SM320F2801PZMEP
Texas Instruments
V62/06619

Compare DCL / BOM Cart
EP
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
LQFP-100

V62/03613-01XE
SM320C50PQM66EP
Texas Instruments
V62/03613

Compare DCL / BOM Cart
EP
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
BQFP-132

V62/09624-01YE
SM320F28335PTPMEP
Texas Instruments
V62/09624

Compare DCL / BOM Cart
EP
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
HLQFP-176

V62/04603-04XA
SM32C6713BGDPM30EP
Texas Instruments
V62/04603

Compare DCL / BOM Cart
EP
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
PBGA-272

5962-9455804QXA
SMJ320C50GFAM66
Texas Instruments
5962-94558

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CPGA-141

5962-9679101QXA
SMJ320C80GFM50
Texas Instruments
5962-96791

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CPGA-305

5962-9679101QYC
SMJ320C80HFHM50
Texas Instruments
5962-96791

Compare DCL / BOM Cart
QML Q
Not qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQFP-320
Part validation activities
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