


DPA Test for Digital Arithmetic ICs
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
DPA Test for Digital Arithmetic ICs
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
422 results found for Arithmetic/Logic/Digital/Microcircuits
Part reference
Quality level / QPL
Package
Type
TID (krads)
SEE (MeV/mg/cm2)
Delay Time [Max]
Number of Bits
Number of Elements
Unit price
Lead time
JAN B
Qualified
QPDSIS-38535
Surface Mount
CFP-16
Full Adder
40ns
4-Bits
1
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
Parity Generator and Checker
235ns
9-Bits
1
JAN B
Qualified
QPDSIS-38535
Surface Mount
CFP-14
Parity Generator and Checker
21ns
9-Bits
1
883
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
Full Adder
4-Bits
1
JAN B
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
Full Adder
40ns
4-Bits
1
JAN B
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-16
Look-Ahead Carry Adder
35ns
4-Bits
1
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
Look-Ahead Carry Adder
18ns
4-Bits
1
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
ALU/Function Generator
57ns
4-Bits
1
QML Q
Qualified
QPDSIS-38535
Surface Mount
CFP-14