Skip to Content
  • Resources
    • COTS For Space WEBINARS
    • EEE Components
    • SPECIFICATIONS / QPLs
    • Events / Webinars
    • Space Talks
    • Tech Articles
    • Manufacturer Notifications
  • Laboratory Services
    • Laboratory Standard Testing
    • Non Standard Testing
    • Silicon Carbide -SiC- Diodes
    • CrowdTesting
    • Optoelectronics
    • Small Sats
    • Representative Projects / Papers
  • Additional Services
    • Industry 4.0 Cybersecurity (IEC 62443) NEW
    • Penetration Test NEW
    • Cybersecurity Certified (CSC) NEW
    • Code Score Matrix NEW
    • Long-term storage of wafers
    • Electronic Design
  • Tools
    • Comparator
    • MYDCLs / BOMs
    • esa-stockplace
  • About Us
  • Proposal Next
  • Sign In
Cookies on the doEEEt website. We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we'll assume that you are happy to receive all cookies on the doEEEt website. However, if you would like to, you can change your cookie settings at any time. Link to cookies policy.
doEEEt DPA Test for DC-DC Switching Controller | doEEEt.com
  • Home
  • How does doEEEt works
  • About us
  • Contact Us
  • Terms of Use
  • Disclaimer
  • Privacy Policy
  • Privacy Policy and Legal Notice
  • Cookie Policy
  • Copyright
  • autosignup2
  • Instant Quote
  • Introducing NanoXplore And Its European FPGA’s ITAR Free
  • Space Talks 3 - Dan Friedlander
  • autosignup3
  • Shopping Cart
  • wpo
  • Data Protection
  • Components
  • Documents
Please enter at least one character to search
ALTER Laboratory Services
Servicio Familia Servicio Familia
Image
Image

DPA Test for DC-DC Switching Controller

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

Fill the form to receive expert assistance from our skilled engineers and technicians

Read Policy

Related content

analysis of material

Material Analysis Techniques for Electronic Components

X-Ray Inspection applied to DPA test

DPA Test

Advances in Packaging and EEE Components

Destructive Physical Analysis (DPA) of EEE Components

Updates of ESCC 21001: Destructive Physical Analysis (DPA) of EEE Components

EEE Parts Results Page

DPA Test for DC-DC Switching Controller

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

EEE Parts Results Page

Applications expected requirements
Category
Category
Recommended
More...
Close
  • Microcircuits
    • Power Management
      • PWM and DC-DC Switching Controller

414 results found for PWM and DC-DC Switching Controller/Power Management/Microcircuits

Reset
Part reference
Quality level / QPL
TOP
Package
Unit price
Lead time

UCC1806L
UCC1806L
Texas Instruments
MFR DS SLUS272

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
GOLD
-55ºC to +125ºC
Surface Mount
CQLCC-20

UC2825ADW
UC2825ADW
Texas Instruments
MFR DS SLUS334

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
SOIC-16

5962-8764502EA
UC1524AJ/883B
Texas Instruments
5962-87645

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16

5962-9958301QPA
TL5001MJGB
Texas Instruments
5962-99583

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-8

5962-9451304MPA
UCC1804J883BC
Texas Instruments
5962-94513

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-8

5962F1422301KXA
MSK 5055-1KRHS
MSK Products Anaren Inc
5962-14223

Compare DCL / BOM Cart
QML K
Not qualified
QPDSIS-38534
-55ºC to +125ºC
Surface Mount
CFP-16

5962F1422302KXA
MSK 5055-2KRHS
MSK Products Anaren Inc
5962-14223

Compare DCL / BOM Cart
QML K
Not qualified
QPDSIS-38534
-55ºC to +125ºC
Surface Mount
CFP-16

5962-9203103Q2A
UC1863L/883B
Texas Instruments
5962-92031

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20

5962-8670402PA
SG1843Y-DESC
Microsemi a Microchip Company
5962-86704

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-8

5962-8670401HA
SG1842F/883B
Microsemi a Microchip Company
5962-86704

Compare DCL / BOM Cart
QML Q
Not qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-10
Part validation activities
Cost & Activity Matrix
  • <
  • 1
  • 2
  • 3
  • 4
  • 5
  • 6
  • 7
  • 8
  • 9
  • >
Alter Technology Laboratory Services
  • Screening
  • Evaluation/Qualification
  • Scanning Acoustic Microscopy
  • RF/Microwave
  • Incoming Inspection
  • DPA

EEE Components
  • Capacitors
  • Microcircuits
  • Resistors
  • Crystals and Oscillators
  • Schottky Barrier Rectifiers
  • Discretes

Laboratory Success Cases
  • GRACE Project
  • XRAY, SAM and Cross Section
  • SiC schottky Diode
  • JUICE Case
  • Deimos Neptuno
  • Melissa III

Company
  • About Us
  • Contact-us
  • How does doEEEt works?
Security & Privacity
  • Privacy Policy and Legal Notice
  • Copyright
  • Contact Clause
  • LinkedIn LinkedIn
  • Twitter Twitter
Copyright © 2025 ALTER TECHNOLOGY TÜV NORD S.A.U
All rights reserved.