Skip to Content
  • Resources
    • COTS For Space WEBINARS
    • EEE Components
    • SPECIFICATIONS / QPLs
    • Events / Webinars
    • Space Talks
    • Tech Articles
    • Manufacturer Notifications
  • Laboratory Services
    • Laboratory Standard Testing
    • Non Standard Testing
    • Silicon Carbide -SiC- Diodes
    • CrowdTesting
    • Optoelectronics
    • Small Sats
    • Representative Projects / Papers
  • Additional Services
    • Industry 4.0 Cybersecurity (IEC 62443) NEW
    • Penetration Test NEW
    • Cybersecurity Certified (CSC) NEW
    • Code Score Matrix NEW
    • Long-term storage of wafers
    • Electronic Design
  • Tools
    • Comparator
    • MYDCLs / BOMs
    • esa-stockplace
  • About Us
  • Proposal Next
  • Sign In
Cookies on the doEEEt website. We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we'll assume that you are happy to receive all cookies on the doEEEt website. However, if you would like to, you can change your cookie settings at any time. Link to cookies policy.
doEEEt DPA Test for Counter-Divider ICs | doEEEt.com
  • Home
  • How does doEEEt works
  • About us
  • Contact Us
  • Terms of Use
  • Disclaimer
  • Privacy Policy
  • Privacy Policy and Legal Notice
  • Cookie Policy
  • Copyright
  • autosignup2
  • Instant Quote
  • Introducing NanoXplore And Its European FPGA’s ITAR Free
  • Space Talks 3 - Dan Friedlander
  • autosignup3
  • Shopping Cart
  • wpo
  • Data Protection
  • Components
  • Documents
Please enter at least one character to search
ALTER Laboratory Services
Servicio Familia Servicio Familia
Image
Image

DPA Test for Counter-Divider ICs

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

Fill the form to receive expert assistance from our skilled engineers and technicians

Read Policy

Related content

analysis of material

Material Analysis Techniques for Electronic Components

X-Ray Inspection applied to DPA test

DPA Test

Advances in Packaging and EEE Components

Destructive Physical Analysis (DPA) of EEE Components

Updates of ESCC 21001: Destructive Physical Analysis (DPA) of EEE Components

EEE Parts Results Page

DPA Test for Counter-Divider ICs

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

EEE Parts Results Page

Applications expected requirements
Category
Category
Recommended
More...
Close
  • Microcircuits
    • Digital
      • Logic
        • Counter-Divider

1303 results found for Counter-Divider/Logic/Digital/Microcircuits

Reset
Part reference
Quality level / QPL
TOP
Package
Count Direction
Type
TID (krads)
SEE (MeV/mg/cm2)
Delay Time [Max]
Number of Bits
Unit price
Lead time

MC100EP016AFAGMC100EP016
MC100EP016AFAGMC100EP016
On Semiconductor
MFR DS MC100EP016A/D

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +70ºC
Surface Mount
LQFP-32
Up
Binary Counter
550ps
8-Bits

SNJ54191J
SNJ54191J
Texas Instruments
QML_SNJ54191_TEX_DS

Compare DCL / BOM Cart
883
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16
Up/Down
Presettable Binary Counter
20ns
4-Bits

5962-9221002MEA
P54FCT163TCMB02
Pyramid Semiconductor
5962-92210

Compare DCL / BOM Cart
QML M
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16
Presettable Binary Counter
11,5ns
4-Bits

M38510/05653BZA
GEM15153BZA
SRI International formerly Sarnoff
MIL-M-38510/56

Compare DCL / BOM Cart
JAN B
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-16
Ripple Binary Counter/Divider
14-Bits

M38510/05605BDC
GEM37305BDC
SRI International formerly Sarnoff
MIL-M-38510/56

Compare DCL / BOM Cart
JAN B
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-14
Binary Counter
7-Bits

5962-90582012A
54F191/Q2A
Rochester
5962-90582

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20
Up/Down
Binary Counter
11ns
4-Bits

5962-9558401QEA
SL54192/BEA
Lansdale
5962-95584

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16
Up/Down
Binary Counter
26ns
4-Bits

SNJ54S163J
SNJ54S163J
Texas Instruments
QML_SNJ54S163_TEX_DS

Compare DCL / BOM Cart
883
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16
Presettable Binary Counter
4-Bits

5962-9221002MFA
P54FCT163TFSMB02
Pyramid Semiconductor
5962-92210

Compare DCL / BOM Cart
QML M
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-16
Presettable Binary Counter
11,5ns
4-Bits

SNJ54196J
SNJ54196J
Texas Instruments
QML_SNJ54196_TEX_DS

Compare DCL / BOM Cart
883
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-14
Divide by 2 and 5
8-Bits
Part validation activities
Cost & Activity Matrix
  • <
  • 1
  • 2
  • 3
  • 4
  • 5
  • 6
  • 7
  • 8
  • 9
  • >
Alter Technology Laboratory Services
  • Screening
  • Evaluation/Qualification
  • Scanning Acoustic Microscopy
  • RF/Microwave
  • Incoming Inspection
  • DPA

EEE Components
  • Capacitors
  • Microcircuits
  • Resistors
  • Crystals and Oscillators
  • Schottky Barrier Rectifiers
  • Discretes

Laboratory Success Cases
  • GRACE Project
  • XRAY, SAM and Cross Section
  • SiC schottky Diode
  • JUICE Case
  • Deimos Neptuno
  • Melissa III

Company
  • About Us
  • Contact-us
  • How does doEEEt works?
Security & Privacity
  • Privacy Policy and Legal Notice
  • Copyright
  • Contact Clause
  • LinkedIn LinkedIn
  • Twitter Twitter
Copyright © 2025 ALTER TECHNOLOGY TÜV NORD S.A.U
All rights reserved.