


DPA Test for Clock Generation
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
DPA Test for Clock Generation
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
71 results found for Clock Generation/Clock and Timing/Microcircuits
Part reference
Quality level / QPL
Package
TID (krads)
SEE (MeV/mg/cm2)
Frequency [Max]
Frequency [Min]
Ratio - Input:Output
Unit price
Lead time
QML Q
Qualified
QPDSIS-38535
Surface Mount
CFP-48
TID (HDR): 100.0
SEL (Let): 109.0
SEU (Let): 109.0
200MHz
6MHz
1:8
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-14
TID (HDR): 500.0
SEL (Let): 120.0
SEU (Let): 80.0
24MHz
QML V
Qualified
QPDSIS-38535
Surface Mount
CFP-14
TID (HDR): 300.0
SEL (Let): 120.0
SEU (Let): 80.0
24MHz
QML Q
Qualified
QPDSIS-38535
Surface Mount
CFP-48
TID (HDR): 100.0
SEL (Let): 109.0
SEU (Let): 109.0
200MHz
6MHz
1:8
QML V
Qualified
QPDSIS-38535
Surface Mount
CFP-48
TID (HDR): 100.0
SEL (Let): 109.0
SEU (Let): 109.0
200MHz
6MHz
1:8
QML Q
Qualified
QPDSIS-38535
Surface Mount
CFP-48
TID (HDR): 100.0
SEL (Let): 109.0
SEU (Let): 109.0
200MHz
6MHz
1:8
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-14
TID (HDR): 300.0
SEL (Let): 120.0
SEU (Let): 80.0
24MHz
QML Q
Qualified
QPDSIS-38535
Surface Mount
CLGA-168
TID (HDR): 100.0
SEL (Let): 109.0
SEU (Let): 109.0
200MHz
750kHz
1:24
QML V
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-14
TID (HDR): 1000.0
SEL (Let): 120.0
SEU (Let): 80.0
24MHz
QML V
Qualified
QPDSIS-38535
Surface Mount
CQFP-64
TID (HDR): 100.0
TID (LDR): 100.0
SEL (Let): 120.0
3,25GHz
3:15
Part validation activities
Cost & Activity Matrix