Skip to Content
  • Resources
    • COTS For Space WEBINARS
    • EEE Components
    • SPECIFICATIONS / QPLs
    • Events / Webinars
    • Space Talks
    • Tech Articles
    • Manufacturer Notifications
  • Laboratory Services
    • Laboratory Standard Testing
    • Non Standard Testing
    • Silicon Carbide -SiC- Diodes
    • CrowdTesting
    • Optoelectronics
    • Small Sats
    • Representative Projects / Papers
  • Additional Services
    • Industry 4.0 Cybersecurity (IEC 62443) NEW
    • Penetration Test NEW
    • Cybersecurity Certified (CSC) NEW
    • Code Score Matrix NEW
    • Long-term storage of wafers
    • Electronic Design
  • Tools
    • Comparator
    • MYDCLs / BOMs
    • esa-stockplace
  • About Us
  • Proposal Next
  • Sign In
Cookies on the doEEEt website. We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we'll assume that you are happy to receive all cookies on the doEEEt website. However, if you would like to, you can change your cookie settings at any time. Link to cookies policy.
doEEEt DPA Test for Circular Connectors | doEEEt.com
  • Home
  • How does doEEEt works
  • About us
  • Contact Us
  • Terms of Use
  • Disclaimer
  • Privacy Policy
  • Privacy Policy and Legal Notice
  • Cookie Policy
  • Copyright
  • autosignup2
  • Instant Quote
  • Introducing NanoXplore And Its European FPGA’s ITAR Free
  • Space Talks 3 - Dan Friedlander
  • autosignup3
  • Shopping Cart
  • wpo
  • Data Protection
  • Components
  • Documents
Please enter at least one character to search
ALTER Laboratory Services
Servicio Familia Servicio Familia
Image
Image

DPA Test for Circular Connectors

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

Fill the form to receive expert assistance from our skilled engineers and technicians

Read Policy

Related content

analysis of material

Material Analysis Techniques for Electronic Components

X-Ray Inspection applied to DPA test

DPA Test

Advances in Packaging and EEE Components

Destructive Physical Analysis (DPA) of EEE Components

Updates of ESCC 21001: Destructive Physical Analysis (DPA) of EEE Components

EEE Parts Results Page

DPA Test for Circular Connectors

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

EEE Parts Results Page

Applications expected requirements
Category
Category
Recommended
More...
Close
  • Connectors
    • Circular
      • Circular Connectors

26830 results found for Circular Connectors/Circular/Connectors

Reset
Part reference
Quality level / QPL
TOP
Package
Contact Gender
Guides and Locking System
Number of Contacts
Unit price
Lead time

340105601B07-13-04SD
MIL-C-38999 Series III 07-13-04SD
Souriau
ESCC 3401/056

Compare DCL / BOM Cart
ESCC B
Qualified
ESCC QPL
-65ºc to +200ºC
Female (Socket)
Triple-Start Self-Locking
4 #16

340105201B06-09-98PD-L
MIL-C-38999 Series I 06-09-98PD-L
Souriau
ESCC 3401/052

Compare DCL / BOM Cart
ESCC B
Qualified
ESCC QPL
-65ºc to +200ºC
Male (Pin)
Bayonet
3 #20

340105601B06-15-97SN-L
MIL-C-38999 Series III 06-15-97SN-L
Souriau
ESCC 3401/056

Compare DCL / BOM Cart
ESCC B
Qualified
ESCC QPL
-65ºc to +200ºC
Female (Socket)
Triple-Start Self-Locking
4 #16, 8 #20

340105601B06-25-03SD-L
MIL-C-38999 Series III 06-25-03SD-L
Souriau
ESCC 3401/056

Compare DCL / BOM Cart
ESCC B
Qualified
ESCC QPL
-65ºc to +200ºC
Female (Socket)
Triple-Start Self-Locking
1 #8 (PWR), 2 #4 (PWR)

340105601B07-25-46SD-L
MIL-C-38999 Series III 07-25-46SD-L
Souriau
ESCC 3401/056

Compare DCL / BOM Cart
ESCC B
Qualified
ESCC QPL
-65ºc to +200ºC
Female (Socket)
Triple-Start Self-Locking
40 #20, 4 #16, 2 #8 (TRIAX)

340105601B66-23-21SE
MIL-C-38999 Series III 66-23-21SE
Souriau
ESCC 3401/056

Compare DCL / BOM Cart
ESCC B
Qualified
ESCC QPL
-65ºc to +200ºC
Female (Socket)
Triple-Start Self-Locking
21 #16

340105201B03-25-43SA
MIL-C-38999 Series I 03-25-43SA
Souriau
ESCC 3401/052

Compare DCL / BOM Cart
ESCC B
Qualified
ESCC QPL
-65ºc to +200ºC
Female (Socket)
Bayonet
23 #20, 20 #16

340104401B07-16-99PA
MIL-C-38999 Series II 07-16-99PA
Souriau
ESCC 3401/044

Compare DCL / BOM Cart
ESCC B
Qualified
ESCC QPL
-65ºc to +200ºC
Male (Pin)
Bayonet
2 #16, 21 #20

340105201B06G23-53SD
MIL-C-38999 Series I 06G23-53SD
Souriau
ESCC 3401/052

Compare DCL / BOM Cart
ESCC B
Qualified
ESCC QPL
-65ºc to +200ºC
Female (Socket)
Bayonet
53 #20

340104401B07-20-35SB
MIL-C-38999 Series II 07-20-35SB
Souriau
ESCC 3401/044

Compare DCL / BOM Cart
ESCC B
Qualified
ESCC QPL
-65ºc to +200ºC
Female (Socket)
Bayonet
79 #22
Part validation activities
Cost & Activity Matrix
  • <
  • 1
  • 2
  • 3
  • 4
  • 5
  • 6
  • 7
  • 8
  • 9
  • >
Alter Technology Laboratory Services
  • Screening
  • Evaluation/Qualification
  • Scanning Acoustic Microscopy
  • RF/Microwave
  • Incoming Inspection
  • DPA

EEE Components
  • Capacitors
  • Microcircuits
  • Resistors
  • Crystals and Oscillators
  • Schottky Barrier Rectifiers
  • Discretes

Laboratory Success Cases
  • GRACE Project
  • XRAY, SAM and Cross Section
  • SiC schottky Diode
  • JUICE Case
  • Deimos Neptuno
  • Melissa III

Company
  • About Us
  • Contact-us
  • How does doEEEt works?
Security & Privacity
  • Privacy Policy and Legal Notice
  • Copyright
  • Contact Clause
  • LinkedIn LinkedIn
  • Twitter Twitter
Copyright © 2025 ALTER TECHNOLOGY TÜV NORD S.A.U
All rights reserved.