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DPA Test for Analog Switch
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
DPA Test for Analog Switch
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
343 results found for Analog Switch/Signal Acquisition-Conditioning/Microcircuits
Part reference
Quality level / QPL
Package
Unit price
Lead time
QML M
Not qualified
QPDSIS-38535
Through Hole Mount
CDIP-16
QML Q
Not qualified
QPDSIS-38535
Surface Mount
CQLCC-20
JAN B
Not qualified
QPDSIS-38535
Through Hole Mount
CDIP-14
883
Not qualified
NOT LISTED IN QPL
Through Hole Mount
CDIP-16
EP
Not qualified
NOT LISTED IN QPL
Surface Mount
TSSOP-16
883
Not qualified
NOT LISTED IN QPL
Surface Mount
CQLCC-20
883
Not qualified
NOT LISTED IN QPL
Through Hole Mount
CDIP-16
883
Not qualified
NOT LISTED IN QPL
Through Hole Mount
TO-100
883
Not qualified
NOT LISTED IN QPL
Through Hole Mount
CDIP-8
JAN B
Not qualified
QPDSIS-38535
Surface Mount
CFP-14
Part validation activities
Cost & Activity Matrix