Skip to Content
  • Resources
    • COTS For Space WEBINARS
    • EEE Components
    • SPECIFICATIONS / QPLs
    • Events / Webinars
    • Space Talks
    • Tech Articles
    • Manufacturer Notifications
  • Laboratory Services
    • Laboratory Standard Testing
    • Non Standard Testing
    • Silicon Carbide -SiC- Diodes
    • CrowdTesting
    • Optoelectronics
    • Small Sats
    • Representative Projects / Papers
  • Additional Services
    • Industry 4.0 Cybersecurity (IEC 62443) NEW
    • Penetration Test NEW
    • Cybersecurity Certified (CSC) NEW
    • Code Score Matrix NEW
    • Long-term storage of wafers
    • Electronic Design
  • Tools
    • Comparator
    • MYDCLs / BOMs
    • esa-stockplace
  • About Us
  • Proposal Next
  • Sign In
Cookies on the doEEEt website. We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we'll assume that you are happy to receive all cookies on the doEEEt website. However, if you would like to, you can change your cookie settings at any time. Link to cookies policy.
doEEEt DPA Test for Aluminum Capacitors | doEEEt.com
  • Home
  • How does doEEEt works
  • About us
  • Contact Us
  • Terms of Use
  • Disclaimer
  • Privacy Policy
  • Privacy Policy and Legal Notice
  • Cookie Policy
  • Copyright
  • autosignup2
  • Instant Quote
  • Introducing NanoXplore And Its European FPGA’s ITAR Free
  • Space Talks 3 - Dan Friedlander
  • autosignup3
  • Shopping Cart
  • wpo
  • Data Protection
  • Components
  • Documents
Please enter at least one character to search
ALTER Laboratory Services
Servicio Familia Servicio Familia
Image
Image

DPA Test for Aluminum Capacitors

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

Fill the form to receive expert assistance from our skilled engineers and technicians

Read Policy

Related content

analysis of material

Material Analysis Techniques for Electronic Components

X-Ray Inspection applied to DPA test

DPA Test

Advances in Packaging and EEE Components

Destructive Physical Analysis (DPA) of EEE Components

Updates of ESCC 21001: Destructive Physical Analysis (DPA) of EEE Components

EEE Parts Results Page

DPA Test for Aluminum Capacitors

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more

EEE Parts Results Page

Applications expected requirements
Category
Category
Recommended
More...
Close
  • Capacitors
    • Aluminum Solid

5869 results found for Aluminum Solid/Capacitors

Reset
Part reference
Quality level / QPL
TOP
Package
Capacitance [Nom]
DC Rated Voltage
Tolerance
Unit price
Lead time

M39018/01R1140M
CUR13 22uF -10%, +75% 75V Axial
Barker Microfarads Inc
MIL-PRF-39018/1

Compare DCL / BOM Cart
FAILURE RATE M
Qualified
QPDSIS-39018
-55ºC to +125ºC
Through Hole Mount
Axial
0,938" L x 0,375" D (23,83mm x 9,53mm)
22uF
75V
-10%, +75%

M39018/03R1061M
CUR17 33uF -10% +30% 150V Case D4
Cornell Dubilier
MIL-PRF-39018/3

Compare DCL / BOM Cart
FAILURE RATE M
Not qualified
QPDSIS-39018
-55ºC to +105ºC
Through Hole Mount
Axial
1,828" L x 0,625" D (46,43mm x 15,88mm)
33uF
150V
-10%, +30%

M39018/03-1348M
CUR17 330uF -10% +75% 75V Case E7
Cornell Dubilier
MIL-PRF-39018/3

Compare DCL / BOM Cart
FAILURE RATE M
Not qualified
QPDSIS-39018
-55ºC to +105ºC
Through Hole Mount
Axial
2,828" L x 0,875" D (56,85mm x 22,22mm)
330uF
75V
-10%, +75%

M39018/03-0669H
CU17 33uF -10% +30% 200V Case D3
Cornell Dubilier
MIL-PRF-39018/3

Compare DCL / BOM Cart
NON-ER
Not qualified
QPDSIS-39018
-55ºC to +105ºC
Through Hole Mount
Axial
1,328" L x 0,875" D (33,73mm x 22,22mm)
33uF
200V
-10%, +30%

M39018/03-1074M
CUR17 220uF -10% +30% 200V Case F4
Cornell Dubilier
MIL-PRF-39018/3

Compare DCL / BOM Cart
FAILURE RATE M
Not qualified
QPDSIS-39018
-55ºC to +105ºC
Through Hole Mount
Axial
3,328" L x 1" D (84,53mm x 25,4mm)
220uF
200V
-10%, +30%

M39018/03R1073P
CUR17 150uF -10%, +30% 200V Axial
Barker Microfarads Inc
MIL-PRF-39018/3

Compare DCL / BOM Cart
FAILURE RATE P
Qualified
QPDSIS-39018
-55ºC to +105ºC
Through Hole Mount
Axial
2,328" L x 1" D (56,85mm x 25,4mm)
150uF
200V
-10%, +30%

M39018/01-1001P
CUR13 220uF -10%, +30% 7V Axial
Barker Microfarads Inc
MIL-PRF-39018/1

Compare DCL / BOM Cart
FAILURE RATE P
Qualified
QPDSIS-39018
-55ºC to +125ºC
Through Hole Mount
Axial
0,938" L x 0,375" D (23,83mm x 9,53mm)
220uF
7V
-10%, +30%

M39018/03-0732
CU17 1,5mF -10% +75% 30V Case E7
Cornell Dubilier
MIL-PRF-39018/3

Compare DCL / BOM Cart
NON-ER
Not qualified
QPDSIS-39018
-55ºC to +105ºC
Through Hole Mount
Axial
2,828" L x 0,875" D (56,85mm x 22,22mm)
1,5mF
30V
-10%, +75%

M39018/03R1377M
CUR17 20uF -10%, +50% 250V Axial
Barker Microfarads Inc
MIL-PRF-39018/3

Compare DCL / BOM Cart
FAILURE RATE M
Qualified
QPDSIS-39018
-55ºC to +105ºC
Through Hole Mount
Axial
1,828" L x 0,625" D (46,43mm x 15,88mm)
20uF
250V
-10%, +50%

M39018/03-1189P
CUR17 82uF -10%, +50% 300V Axial
Barker Microfarads Inc
MIL-PRF-39018/3

Compare DCL / BOM Cart
FAILURE RATE P
Qualified
QPDSIS-39018
-55ºC to +105ºC
Through Hole Mount
Axial
3,328" L x 0,875" D (84,53mm x 15,88mm)
82uF
300V
-10%, +50%
Part validation activities
Cost & Activity Matrix
  • <
  • 1
  • 2
  • 3
  • 4
  • 5
  • 6
  • 7
  • 8
  • 9
  • >
Alter Technology Laboratory Services
  • Screening
  • Evaluation/Qualification
  • Scanning Acoustic Microscopy
  • RF/Microwave
  • Incoming Inspection
  • DPA

EEE Components
  • Capacitors
  • Microcircuits
  • Resistors
  • Crystals and Oscillators
  • Schottky Barrier Rectifiers
  • Discretes

Laboratory Success Cases
  • GRACE Project
  • XRAY, SAM and Cross Section
  • SiC schottky Diode
  • JUICE Case
  • Deimos Neptuno
  • Melissa III

Company
  • About Us
  • Contact-us
  • How does doEEEt works?
Security & Privacity
  • Privacy Policy and Legal Notice
  • Copyright
  • Contact Clause
  • LinkedIn LinkedIn
  • Twitter Twitter
Copyright © 2025 ALTER TECHNOLOGY TÜV NORD S.A.U
All rights reserved.