Servicio Familia 
DPA Test for 1553 Transceivers
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
DPA Test for 1553 Transceivers
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed. >> Read more
EEE Parts Results Page
907 results found for 1553/Communication-Interface/Microcircuits
Part reference
Quality level / QPL
Package
Protocol Compatible
Type
TID (krads)
SEE (MeV/mg/cm2)
Number of Channels
Unit price
Lead time
QML H
Not qualified
QPDSIS-38534
Through Hole Mount
CDIP-36
Transceiver
2
QML H
Not qualified
QPDSIS-38534
Through Hole Mount
CDIP-36
Transceiver
2
QML H
Qualified
QPDSIS-38534
Through Hole Mount
CDIP-36
Driver/Receiver
2
QML H
Qualified
QPDSIS-38534
Through Hole Mount
Hybrid DIP-24
Driver/Receiver
1
QML K
Qualified
QPDSIS-38534
Surface Mount
CFP-36
Transceiver
2
QML H
Qualified
QPDSIS-38534
Through Hole Mount
CPGA-100
1553,1760
Transceiver
2
QML H
Qualified
QPDSIS-38534
Surface Mount
CFP-36
Transceiver
2
QML H
Not qualified
QPDSIS-38534
Surface Mount
CFP-36
Transceiver
2
SPACE
Not qualified
NOT LISTED IN QPL
Surface Mount
FP-46
SPACE
Not qualified
NOT LISTED IN QPL
Surface Mount
FP-64
Part validation activities
Cost & Activity Matrix