14814 results found for
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
TOTAL IONIZING DOSE TEST REPORT (05T-RTSX32SU-D1AYJ1)
TD
/
Active
MNFR
Detail / Drawing
- / -
Active
The purpose of this test is to define a way for verifying the diode recovery stress capability of power MOSFET transistors. The focus is on simplicity and practicality.
DLA
Method
/ w/Change1
Active
DLA
Detail / Drawing
D / Det.Spec.&Am.2
Active
DLA
Detail / Drawing
C / w/Amendment 1
Active
MNFR
Detail / Drawing
E / -
Active
MNFR
Detail / Drawing
F / -
Active
DLA
Detail / Drawing
B / Det.Spec.&Am.1
Active
JAXA
Detail / Drawing
A / w/Notice of Change 1
Active
JAXA
Detail / Drawing
D / -
Active