14814 results found for
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
The purpose of this test method is for measuring a temperature-sensitive static parameter under conditions such that the product of the applied voltage and current at...
DLA
Method
/ w/Change3
Active
DLA
Detail / Drawing
B / -
Active
DLA
Detail / Drawing
C / Det.Spec.&Am.1
Active
DLA
Detail / Drawing
B / -
Active
MNFR
Detail / Drawing
05-Jul-2017 / -
Active
DLA
Detail / Drawing
A / -
Active
DLA
Detail / Drawing
B / -
Active
DLA
Detail / Drawing
C / Det.Spec.&Am.1
Active
Environmental Test Method Standard for Microcircuits: Ionizing radiation (total dose) test procedure
This test procedure defines the requirements for testing packaged semiconductor integrated circuits for ionizing radiation (total dose) effects from a cobalt-60 (60Co)...
DLA
Method
9 /
Active