MIL-STD-750, Method 4000 Diode Electrical Test Methods for Semiconductor Devices Part 4: Condition for measurement of diode static parameters

The purpose of this test method is for measuring a temperature-sensitive static parameter under conditions such that the product of the applied voltage and current at the test point produces a power dissipation level that will cause significant heating of the junction, the measured result may be subject to errors due to thermal or transient effects.