


C-SAM for VCO Oscillator
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
C-SAM for VCO Oscillator
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
14 results found for VCO/Frequency Generation/RF-Microwave Microcircuits/Microcircuits
Part reference
Quality level / QPL
Package
Unit price
Lead time
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
QFN-32
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
QFN-32
QML H
Not qualified
QPDSIS-38534
Surface Mount
CQLCC-20
QML Q
Qualified
QPDSIS-38535
Surface Mount
CFP-16
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-14
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
883
Qualified
QPDSIS-38535
Surface Mount
CFP-16
ESCC B
Not qualified
ESCC QPL
DIE
DIE
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-16
Part validation activities
Cost & Activity Matrix