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doEEEt Bond Pull Test for VCO Oscillator | doEEEt.com
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Bond Pull Test for VCO Oscillator

Bond Pull test evaluates bond strength distributions and determines compliance with the specified bond strength requirements of the applicable procurement document. Bond Pull test is applied to the wire-to-die bond, wire-to-substrate bond, or the wire-to-package lead bond inside the package of wire-connected devices bonded by soldering, thermo-compression, ultrasonic, or related techniques. >> Read more

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EEE Parts Results Page

Bond Pull Test for VCO Oscillator

Bond Pull test evaluates bond strength distributions and determines compliance with the specified bond strength requirements of the applicable procurement document. Bond Pull test is applied to the wire-to-die bond, wire-to-substrate bond, or the wire-to-package lead bond inside the package of wire-connected devices bonded by soldering, thermo-compression, ultrasonic, or related techniques. >> Read more

EEE Parts Results Page

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  • Microcircuits
    • RF-Microwave Microcircuits
      • Frequency Generation
        • VCO

14 results found for VCO/Frequency Generation/RF-Microwave Microcircuits/Microcircuits

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Package
Unit price
Lead time

MAOC-009263
MAOC-009263
MACOM Technology Solutions Inc
MFR DS MAOC-009263

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
QFN-32

MAOC-009262
MAOC-009262
MACOM Technology Solutions Inc
MFR DS MAOC-009262

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
QFN-32

8102101FA
SNJ54LS629W
Texas Instruments
81021

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-16

5962-9204601M2A
SNJ54LS628FK
Texas Instruments
5962-92046

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20

5962-9682801H2C
MSK1343B
MSK Products Anaren Inc
5962-96828

Compare DCL / BOM Cart
QML H
Not qualified
QPDSIS-38534
-55ºC to +125ºC
Surface Mount
CQLCC-20

901200301C
CHV1203-98S
United Monolithic Semiconductors
ESCC 9012/003

Compare DCL / BOM Cart
ESCC C
Not qualified
ESCC QPL
-55ºC to +125ºC
DIE
DIE

SNJ54S124J
SNJ54S124J
Texas Instruments
QML_SNJ54S124_TEX_DS

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883
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16

901200301B
CHV1203-98S
United Monolithic Semiconductors
ESCC 9012/003

Compare DCL / BOM Cart
ESCC B
Not qualified
ESCC QPL
-55ºC to +125ºC
DIE
DIE

SNJ54S124W
SNJ54S124W
Texas Instruments
QML_SNJ54S124_TEX_DS

Compare DCL / BOM Cart
883
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-16

901200401B
CHV1206-98S
United Monolithic Semiconductors
ESCC 9012/004

Compare DCL / BOM Cart
ESCC B
Not qualified
ESCC QPL
-55ºC to +125ºC
DIE
DIE
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