Servicio Familia 
C-SAM for Tunnel Diodes
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
C-SAM for Tunnel Diodes
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
20 results found for Tunnel/RF-Microwave Diode/Diode/Discretes
Part reference
Quality level / QPL
Package
Power Dissipation [Max]
TID (krads)
Forward Current [Max]
Total Capacitance [Max]
Unit price
Lead time
JANTXV EQ
Not qualified
NOT LISTED IN QPL
Through Hole Mount
Axial
JANTXV EQ
Not qualified
NOT LISTED IN QPL
Through Hole Mount
Axial
JAN
Not qualified
QPDSIS-19500
Through Hole Mount
DO-17
HIGH RELIABILITY
Not qualified
NOT LISTED IN QPL
Through Hole Mount
Axial
HIGH RELIABILITY
Not qualified
NOT LISTED IN QPL
Through Hole Mount
Axial
JANS EQ
Not qualified
NOT LISTED IN QPL
Through Hole Mount
Axial
JANTX EQ
Not qualified
NOT LISTED IN QPL
Through Hole Mount
Axial
JANS EQ
Not qualified
NOT LISTED IN QPL
Through Hole Mount
Axial
JAN
Not qualified
QPDSIS-19500
Through Hole Mount
DO-17
JAN
Not qualified
QPDSIS-19500
Through Hole Mount
DO-17
Part validation activities
Cost & Activity Matrix