


C-SAM for Supervisory-Monitoring ICs
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
C-SAM for Supervisory-Monitoring ICs
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
329 results found for Supervisory and Monitoring/Power Management/Microcircuits
Part reference
Quality level / QPL
Package
Unit price
Lead time
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
SC70-3
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
CQLCC-20
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
TSSOP-8
EP
Not qualified
NOT LISTED IN QPL
Surface Mount
TSSOP-8
EP
Not qualified
NOT LISTED IN QPL
Surface Mount
SOIC-8
883
Not qualified
NOT LISTED IN QPL
Through Hole Mount
TO-99
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
QML Q
Not qualified
QPDSIS-38535
Through Hole Mount
CDIP-16
883
Not qualified
NOT LISTED IN QPL
Through Hole Mount
CDIP-8
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
Part validation activities
Cost & Activity Matrix