


C-SAM for Sample and Hold Amplifier
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
C-SAM for Sample and Hold Amplifier
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
23 results found for Sample and Hold/Amplifier/Signal Acquisition-Conditioning/Microcircuits
Part reference
Quality level / QPL
Package
Unit price
Lead time
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-14
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
TO-99
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
QML V
Qualified
QPDSIS-38535
Surface Mount
CFP-14 (Gull Wing)
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-16
QML V
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-14
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-14
QML V
Not qualified
QPDSIS-38535
Through Hole Mount
CDIP-14
SPACE
Not qualified
ADI Space QPL
Surface Mount
CFP-14
JAN B
Qualified
QPDSIS-38535
Through Hole Mount
TO-99
Part validation activities
Cost & Activity Matrix