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doEEEt Cross Sectioning for SRAM Memory | doEEEt.com
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Cross Sectioning for SRAM Memory

The cross-sectioning process provides access to the device internal structure, its materials and design. Electronics components are often subjected to cross-sectioning to detect the defects that could not be found using other testing techniques. Cross-sectioning typically involves three discrete steps: mounting the sample in a block of epoxy resin to form the specimen, grinding or cutting the specimen and finally polishing the exposed surface. >> Read more

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EEE Parts Results Page

Cross Sectioning for SRAM Memory

The cross-sectioning process provides access to the device internal structure, its materials and design. Electronics components are often subjected to cross-sectioning to detect the defects that could not be found using other testing techniques. Cross-sectioning typically involves three discrete steps: mounting the sample in a block of epoxy resin to form the specimen, grinding or cutting the specimen and finally polishing the exposed surface. >> Read more

EEE Parts Results Page

Applications expected requirements
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  • Microcircuits
    • Digital
      • Memory
        • RAM
          • SRAM

6087 results found for SRAM/RAM/Memory/Digital/Microcircuits

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Part reference
Quality level / QPL
TOP
Package
TID (krads)
SEE (MeV/mg/cm2)
Access Time [Max]
Memory Size
Unit price
Lead time

71024S12TYGI
71024S12TYGI
Renesas Electronics formerly Intersil
MFR DS 71024S

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
SOJ-32
12ns
1M (128K x 8)

5962-8552507XA
P4C164-35DWMB
Pyramid Semiconductor
5962-85525

Compare DCL / BOM Cart
883
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-28
70 ns
64K (8K x 8)

5962-9559505HNA
WS128K32-55G2UQ
Mercury Systems Inc
5962-95595

Compare DCL / BOM Cart
QML H
Qualified
QPDSIS-38534
-55ºC to +125ºC
Surface Mount
CQFP-68 (Gull Wing)
55 ns
4M (128K x 32)

5962-9669108HYC
WMS128K8-25C
Mercury Systems Inc
5962-96691

Compare DCL / BOM Cart
QML H
Qualified
QPDSIS-38534
-55ºC to +125ºC
Through Hole Mount
CDIP-32
25 ns
1M (128K x 8)

5962R9960707QYC
UT8Q512E-YCC
Cobham Colorado Springs
5962-99607

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to 125ºC
Surface Mount
CFP-36
TID (HDR): 100.0
SEL (Let): 110.0
SEU (Let): 3.0
20 ns
4M (512K x 8)

5962-9559515HNA
WS128K32H-25G2UQ
Mercury Systems Inc
5962-95595

Compare DCL / BOM Cart
QML H
Qualified
QPDSIS-38534
-55ºC to +125ºC
Surface Mount
CQFP-68 (Gull Wing)
25 ns
4M (128K x 32)

5962F9684501QXC
UT7C138C45GCCH
Cobham Colorado Springs
5962-96845

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CPGA-68
TID (HDR): 300.0
SEL (Let): 120.0
SEU (Let): 65.0
45 ns
32K (4K x 8)

8413205SA
CY7C167A-35KMB
Teledyne e2v Inc
84132

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-20
35 ns
16K (16K x 1)

5962-3829436MZA
P4C164L-70DMB
Pyramid Semiconductor
5962-38294

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-28
70 ns
64K (8K x 8)

5962R8959849VZC
AT65609EHV-C940SR
Microchip Technology Nantes formerly Atmel
5962-89598

Compare DCL / BOM Cart
QML V
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-32
TID (HDR): 100.0
SEL (Let): 111.0
SEU (Let): 3.0
40 ns
1M (128K x 8)
Part validation activities
Cost & Activity Matrix
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