


Cross Sectioning for SRAM Memory
The cross-sectioning process provides access to the device internal structure, its materials and design. Electronics components are often subjected to cross-sectioning to detect the defects that could not be found using other testing techniques. Cross-sectioning typically involves three discrete steps: mounting the sample in a block of epoxy resin to form the specimen, grinding or cutting the specimen and finally polishing the exposed surface. >> Read more
EEE Parts Results Page
Cross Sectioning for SRAM Memory
The cross-sectioning process provides access to the device internal structure, its materials and design. Electronics components are often subjected to cross-sectioning to detect the defects that could not be found using other testing techniques. Cross-sectioning typically involves three discrete steps: mounting the sample in a block of epoxy resin to form the specimen, grinding or cutting the specimen and finally polishing the exposed surface. >> Read more
EEE Parts Results Page
6087 results found for SRAM/RAM/Memory/Digital/Microcircuits
Part reference
Quality level / QPL
Package
TID (krads)
SEE (MeV/mg/cm2)
Access Time [Max]
Memory Size
Unit price
Lead time
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
SOJ-32
12ns
1M (128K x 8)
883
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-28
70 ns
64K (8K x 8)
QML H
Qualified
QPDSIS-38534
Surface Mount
CQFP-68 (Gull Wing)
55 ns
4M (128K x 32)
QML H
Qualified
QPDSIS-38534
Through Hole Mount
CDIP-32
25 ns
1M (128K x 8)
QML Q
Qualified
QPDSIS-38535
Surface Mount
CFP-36
TID (HDR): 100.0
SEL (Let): 110.0
SEU (Let): 3.0
20 ns
4M (512K x 8)
QML H
Qualified
QPDSIS-38534
Surface Mount
CQFP-68 (Gull Wing)
25 ns
4M (128K x 32)
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CPGA-68
TID (HDR): 300.0
SEL (Let): 120.0
SEU (Let): 65.0
45 ns
32K (4K x 8)
QML Q
Qualified
QPDSIS-38535
Surface Mount
CFP-20
35 ns
16K (16K x 1)
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-28
70 ns
64K (8K x 8)
QML V
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-32
TID (HDR): 100.0
SEL (Let): 111.0
SEU (Let): 3.0
40 ns
1M (128K x 8)
Part validation activities
Cost & Activity Matrix