Skip to Content
  • Resources
    • COTS For Space WEBINARS
    • EEE Components
    • SPECIFICATIONS / QPLs
    • Events / Webinars
    • Space Talks
    • Tech Articles
    • Manufacturer Notifications
  • Laboratory Services
    • Laboratory Standard Testing
    • Non Standard Testing
    • Silicon Carbide -SiC- Diodes
    • CrowdTesting
    • Optoelectronics
    • Small Sats
    • Representative Projects / Papers
  • Additional Services
    • Industry 4.0 Cybersecurity (IEC 62443) NEW
    • Penetration Test NEW
    • Cybersecurity Certified (CSC) NEW
    • Code Score Matrix NEW
    • Long-term storage of wafers
    • Electronic Design
  • Tools
    • Comparator
    • MYDCLs / BOMs
    • esa-stockplace
  • About Us
  • Proposal Next
  • Sign In
Cookies on the doEEEt website. We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we'll assume that you are happy to receive all cookies on the doEEEt website. However, if you would like to, you can change your cookie settings at any time. Link to cookies policy.
doEEEt Cross Sectioning for SCR-Thyristor | doEEEt.com
  • Home
  • How does doEEEt works
  • About us
  • Contact Us
  • Terms of Use
  • Disclaimer
  • Privacy Policy
  • Privacy Policy and Legal Notice
  • Cookie Policy
  • Copyright
  • autosignup2
  • Instant Quote
  • Introducing NanoXplore And Its European FPGA’s ITAR Free
  • Space Talks 3 - Dan Friedlander
  • autosignup3
  • Shopping Cart
  • wpo
  • Data Protection
  • Components
  • Documents
Please enter at least one character to search
ALTER Laboratory Services
Servicio Familia Servicio Familia
Image
Image

Cross Sectioning for SCR-Thyristor

The cross-sectioning process provides access to the device internal structure, its materials and design. Electronics components are often subjected to cross-sectioning to detect the defects that could not be found using other testing techniques. Cross-sectioning typically involves three discrete steps: mounting the sample in a block of epoxy resin to form the specimen, grinding or cutting the specimen and finally polishing the exposed surface. >> Read more

Fill the form to receive expert assistance from our skilled engineers and technicians

Read Policy

Related content

Microsection images.

Test combination for detecting defects in plastic ICs

Importance of SAM for delamination detection

Importance of the SAM for delamination detection

C-Sam-internal-inspection-

SAM Capabilities, Analyse the internal structure in EEE Parts

Microsection Inspection - Failure Analysis

Failure Analysis in Microsection Inspection

Constructional Analysis

Constructional Analysis in Microsection Inspection

EEE Parts Results Page

Cross Sectioning for SCR-Thyristor

The cross-sectioning process provides access to the device internal structure, its materials and design. Electronics components are often subjected to cross-sectioning to detect the defects that could not be found using other testing techniques. Cross-sectioning typically involves three discrete steps: mounting the sample in a block of epoxy resin to form the specimen, grinding or cutting the specimen and finally polishing the exposed surface. >> Read more

EEE Parts Results Page

Applications expected requirements
Category
Category
Recommended
More...
Close
  • Discretes
    • SCR-Thyristor

184 results found for SCR-Thyristor/Discretes

Reset
Part reference
Quality level / QPL
TOP
Package
TID (krads)
Average Output Rectified Current [Max]
Gate Trigger Current [Max]
Gate Trigger Voltage [Max]
Gate Voltage [Max]
Unit price
Lead time

JAN2N2326S
2N2326S TO-205AD (TO-39)
VPT Components
MIL-PRF-19500/276

Compare DCL / BOM Cart
JAN
Qualified
QPDSIS-19500
-65ºC to +125ºC
Through Hole Mount
TO-205AD (TO-39)
0,22A
0,35mA
1V
6V

JANTX2N688
2N688 TO-208AA (TO-48)
Semitronics Corp
MIL-PRF-19500/108

Compare DCL / BOM Cart
JANTX
Qualified
QPDSIS-19500
-65ºC to +120ºC
Point to Point Wiring
TO-208AA (TO-48)
16A
80mA
3V
5V

JANTX2N2324
2N2324 TO-205AA (TO-5)
Microsemi a Microchip Company
MIL-PRF-19500/276

Compare DCL / BOM Cart
JANTX
Not qualified
QPDSIS-19500
-65ºC to +125ºC
Through Hole Mount
TO-205AA (TO-5)
0,22A
0,35mA
1V
6V

JANTXV2N2323
2N2323 TO-205AA (TO-5)
Microsemi a Microchip Company
MIL-PRF-19500/276

Compare DCL / BOM Cart
JANTXV
Not qualified
QPDSIS-19500
-65ºC to +125ºC
Through Hole Mount
TO-205AA (TO-5)
0,22A
0,35mA
1V
6V

JANTXV2N2326A
2N2326A TO-205AA (TO-5)
VPT Components
MIL-PRF-19500/276

Compare DCL / BOM Cart
JANTXV
Qualified
QPDSIS-19500
-65ºC to +125ºC
Through Hole Mount
TO-205AA (TO-5)
0,22A
0,075mA
1V
6V

JAN2N2326
2N2326 TO-205AA (TO-5)
VPT Components
MIL-PRF-19500/276

Compare DCL / BOM Cart
JAN
Qualified
QPDSIS-19500
-65ºC to +125ºC
Through Hole Mount
TO-205AA (TO-5)
0,22A
0,35mA
1V
6V

JANTX2N2323A
2N2323A TO-205AA (TO-5)
VPT Components
MIL-PRF-19500/276

Compare DCL / BOM Cart
JANTX
Qualified
QPDSIS-19500
-65ºC to +125ºC
Through Hole Mount
TO-205AA (TO-5)
0,22A
0,075mA
1V
6V

JAN2N2324S
2N2324S TO-205AD (TO-39)
VPT Components
MIL-PRF-19500/276

Compare DCL / BOM Cart
JAN
Qualified
QPDSIS-19500
-65ºC to +125ºC
Through Hole Mount
TO-205AD (TO-39)
0,22A
0,35mA
1V
6V

JAN2N2619A
2N2619A TO-64
Semitronics Corp
MIL-PRF-19500/168

Compare DCL / BOM Cart
JAN
Qualified
QPDSIS-19500
-65ºC to +145ºC
Point to Point Wiring
TO-64
4,7A
30mA
2V
10V

JAN2N1772A
2N1772A TO-64
Semitronics Corp
MIL-PRF-19500/168

Compare DCL / BOM Cart
JAN
Qualified
QPDSIS-19500
-65ºC to +145ºC
Point to Point Wiring
TO-64
4,7A
30mA
2V
10V
Part validation activities
Cost & Activity Matrix
  • <
  • 1
  • 2
  • 3
  • 4
  • 5
  • 6
  • 7
  • 8
  • 9
  • >
Alter Technology Laboratory Services
  • Screening
  • Evaluation/Qualification
  • Scanning Acoustic Microscopy
  • RF/Microwave
  • Incoming Inspection
  • DPA

EEE Components
  • Capacitors
  • Microcircuits
  • Resistors
  • Crystals and Oscillators
  • Schottky Barrier Rectifiers
  • Discretes

Laboratory Success Cases
  • GRACE Project
  • XRAY, SAM and Cross Section
  • SiC schottky Diode
  • JUICE Case
  • Deimos Neptuno
  • Melissa III

Company
  • About Us
  • Contact-us
  • How does doEEEt works?
Security & Privacity
  • Privacy Policy and Legal Notice
  • Copyright
  • Contact Clause
  • LinkedIn LinkedIn
  • Twitter Twitter
Copyright © 2025 ALTER TECHNOLOGY TÜV NORD S.A.U
All rights reserved.