


Cross Sectioning for RF Variable Gain Amplifier
The cross-sectioning process provides access to the device internal structure, its materials and design. Electronics components are often subjected to cross-sectioning to detect the defects that could not be found using other testing techniques. Cross-sectioning typically involves three discrete steps: mounting the sample in a block of epoxy resin to form the specimen, grinding or cutting the specimen and finally polishing the exposed surface. >> Read more
EEE Parts Results Page
Cross Sectioning for RF Variable Gain Amplifier
The cross-sectioning process provides access to the device internal structure, its materials and design. Electronics components are often subjected to cross-sectioning to detect the defects that could not be found using other testing techniques. Cross-sectioning typically involves three discrete steps: mounting the sample in a block of epoxy resin to form the specimen, grinding or cutting the specimen and finally polishing the exposed surface. >> Read more
EEE Parts Results Page
11 results found for Variable Gain Amplifier/RF Amplifiers/RF-Microwave Microcircuits/Microcircuits
Part reference
Quality level / QPL
Package
Unit price
Lead time
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
EP
Not qualified
NOT LISTED IN QPL
Surface Mount
QSOP-20
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-8
EP
Not qualified
NOT LISTED IN QPL
Surface Mount
WQFN-24
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-14
SPACE
Not qualified
ADI Space QPL
Surface Mount
CFP-16
EM
Not qualified
NOT LISTED IN QPL
Surface Mount
CFP-16
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-16
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
TO-99
SPACE
Not qualified
ADI Space QPL
Surface Mount
CFP-16
Part validation activities
Cost & Activity Matrix