


C-SAM for RF Variable Gain Amplifier
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
C-SAM for RF Variable Gain Amplifier
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
11 results found for Variable Gain Amplifier/RF Amplifiers/RF-Microwave Microcircuits/Microcircuits
Part reference
Quality level / QPL
Package
Unit price
Lead time
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-14
SPACE
Not qualified
ADI Space QPL
Surface Mount
CFP-16
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
EP
Not qualified
NOT LISTED IN QPL
Surface Mount
QSOP-20
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-8
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
TO-99
SPACE
Not qualified
ADI Space QPL
Surface Mount
CFP-16
EP
Not qualified
NOT LISTED IN QPL
Surface Mount
WQFN-24
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-16
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-14
Part validation activities
Cost & Activity Matrix