Skip to Content
  • Resources
    • COTS For Space WEBINARS
    • EEE Components
    • SPECIFICATIONS / QPLs
    • Events / Webinars
    • Space Talks
    • Tech Articles
    • Manufacturer Notifications
  • Laboratory Services
    • Laboratory Standard Testing
    • Non Standard Testing
    • Silicon Carbide -SiC- Diodes
    • CrowdTesting
    • Optoelectronics
    • Small Sats
    • Representative Projects / Papers
  • Additional Services
    • Industry 4.0 Cybersecurity (IEC 62443) NEW
    • Penetration Test NEW
    • Cybersecurity Certified (CSC) NEW
    • Code Score Matrix NEW
    • Long-term storage of wafers
    • Electronic Design
  • Tools
    • Comparator
    • MYDCLs / BOMs
    • esa-stockplace
  • About Us
  • Proposal Next
  • Sign In
Cookies on the doEEEt website. We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we'll assume that you are happy to receive all cookies on the doEEEt website. However, if you would like to, you can change your cookie settings at any time. Link to cookies policy.
doEEEt C-SAM for RF Transformers | doEEEt.com
  • Home
  • How does doEEEt works
  • About us
  • Contact Us
  • Terms of Use
  • Disclaimer
  • Privacy Policy
  • Privacy Policy and Legal Notice
  • Cookie Policy
  • Copyright
  • autosignup2
  • Instant Quote
  • Introducing NanoXplore And Its European FPGA’s ITAR Free
  • Space Talks 3 - Dan Friedlander
  • autosignup3
  • Shopping Cart
  • wpo
  • Data Protection
  • Components
  • Documents
Please enter at least one character to search
ALTER Laboratory Services
Servicio Familia Servicio Familia
Image
Image

C-SAM for RF Transformers

C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.

Fill the form to receive expert assistance from our skilled engineers and technicians

Read Policy

Related content

Frequently Asked Questions (FAQs) – Scanning Acoustic Microscopy

Microsection images.

Test combination for detecting defects in plastic ICs

Importance of SAM for delamination detection

Importance of the SAM for delamination detection

Scanning Acoustic Microscopy

CSAM Techniques for COTS Validation

EEE Parts Results Page

C-SAM for RF Transformers

C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.

EEE Parts Results Page

Applications expected requirements
Category
Category
Recommended
More...
Close
  • Transformers
    • RF Transformers

24 results found for RF Transformers/Transformers

Reset
Part reference
Quality level / QPL
TOP
Package
Frequency [Max]
Turns Ratio
Unit price
Lead time

AE458RFW04B1SZ
AE458RFW04B1SZ
Coilcraft Inc
MFR DS AE424

Compare DCL / BOM Cart
EM
Not qualified
NOT LISTED IN QPL
-40ºC to +85ºC
Surface Mount
See Spec
(4,19 x 4,45) mm
750MHz
1:4

AE458RFW04C1SF
AE458RFW04C1SF
Coilcraft Inc
MFR DS AE424

Compare DCL / BOM Cart
ESCC B EQ
Not qualified
NOT LISTED IN QPL
-40ºC to +85ºC
Surface Mount
See Spec
(4,19 x 4,45) mm
800MHz
1:4

AE458RFW02B1SZ
AE458RFW02B1SZ
Coilcraft Inc
MFR DS AE424

Compare DCL / BOM Cart
EM
Not qualified
NOT LISTED IN QPL
-40ºC to +85ºC
Surface Mount
See Spec
(4,19 x 4,45) mm
500MHz
1:2

AE458RFW04C1SZ
AE458RFW04C1SZ
Coilcraft Inc
MFR DS AE424

Compare DCL / BOM Cart
EM
Not qualified
NOT LISTED IN QPL
-40ºC to +85ºC
Surface Mount
See Spec
(4,19 x 4,45) mm
800MHz
1:4

AE458RFW01B1SF
AE458RFW01B1SF
Coilcraft Inc
MFR DS AE424

Compare DCL / BOM Cart
ESCC B EQ
Not qualified
NOT LISTED IN QPL
-40ºC to +85ºC
Surface Mount
See Spec
(4,19 x 4,45) mm
750MHz
1:1

AE458RFW04B1SF
AE458RFW04B1SF
Coilcraft Inc
MFR DS AE424

Compare DCL / BOM Cart
ESCC B EQ
Not qualified
NOT LISTED IN QPL
-40ºC to +85ºC
Surface Mount
See Spec
(4,19 x 4,45) mm
750MHz
1:4

AE458RFW08B1SZ
AE458RFW08B1SZ
Coilcraft Inc
MFR DS AE424

Compare DCL / BOM Cart
EM
Not qualified
NOT LISTED IN QPL
-40ºC to +85ºC
Surface Mount
See Spec
(4,19 x 4,45) mm
600MHz
1:8

AE458RFW08B1SF
AE458RFW08B1SF
Coilcraft Inc
MFR DS AE424

Compare DCL / BOM Cart
ESCC B EQ
Not qualified
NOT LISTED IN QPL
-40ºC to +85ºC
Surface Mount
See Spec
(4,19 x 4,45) mm
600MHz
1:8

AE458RFW04B2SF
AE458RFW04B2SF
Coilcraft Inc
MFR DS AE424

Compare DCL / BOM Cart
ESCC B EQ
Not qualified
NOT LISTED IN QPL
-40ºC to +85ºC
Surface Mount
See Spec
(4,19 x 4,45) mm
1,2GHz
1:4

AE458RFW03B1SZ
AE458RFW03B1SZ
Coilcraft Inc
MFR DS AE424

Compare DCL / BOM Cart
EM
Not qualified
NOT LISTED IN QPL
-40ºC to +85ºC
Surface Mount
See Spec
(4,19 x 4,45) mm
900MHz
1:3
Part validation activities
Cost & Activity Matrix
  • <
  • 1
  • >
Alter Technology Laboratory Services
  • Screening
  • Evaluation/Qualification
  • Scanning Acoustic Microscopy
  • RF/Microwave
  • Incoming Inspection
  • DPA

EEE Components
  • Capacitors
  • Microcircuits
  • Resistors
  • Crystals and Oscillators
  • Schottky Barrier Rectifiers
  • Discretes

Laboratory Success Cases
  • GRACE Project
  • XRAY, SAM and Cross Section
  • SiC schottky Diode
  • JUICE Case
  • Deimos Neptuno
  • Melissa III

Company
  • About Us
  • Contact-us
  • How does doEEEt works?
Security & Privacity
  • Privacy Policy and Legal Notice
  • Copyright
  • Contact Clause
  • LinkedIn LinkedIn
  • Twitter Twitter
Copyright © 2025 ALTER TECHNOLOGY TÜV NORD S.A.U
All rights reserved.